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Search query: grazing-incidence wide-angle scattering (GIWAXS)

40 articles match your search "grazing-incidence wide-angle scattering (GIWAXS)"

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A software package is described for grazing-incidence wide-angle X-ray scattering geared towards weakly ordered materials, with functionality including scattering intensity normalization/uncertainty estimation, scattering pattern indexing and refractive shift correction.

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INSIGHT is a Python-based software tool for reducing and batch processing large grazing-incidence wide- and small-angle X-ray scattering data sets and extracting structural, orientational and morphological information on thin films.

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A computational method that directly translates the scattering peak information to crystalline domain shapes and orientations is presented. The method is demonstrated at a synchrotron beamline with a standard X-ray scattering setup.

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A first-generation-synchrotron-class X-ray laboratory microsource, coupled to a three-pinhole camera, is presented. It allows small- and wide-angle X-ray scattering images to be acquired simultaneously, and scanning small- and wide-angle X-ray scattering microscopy to be carried out.

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Advanced grazing-incidence techniques have developed significantly during recent years. With the ongoing progress in instrumentation, novel methods have emerged which allow for an in-depth morphology characterization of modern soft-matter materials. Examples are in situ and in operando grazing-incidence small-angle X-ray scattering (GISAXS), micro- and nanofocused GISAXS, time-of-flight (TOF) grazing-incidence small-angle neutron scattering (GISANS) and surface-sensitive resonant soft X-ray scattering techniques, including the potential to investigate polarization. Progress in software for data analysis is another important aspect.

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Two small molecules having different alkyl side chains showed considerably different crystalline structures, resulting in different device performances.

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J. Appl. Cryst. (2007). 40, s642-s644
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The annealing effect on lamellar stacking structure of polyethylene thin films prepared on silicon wafers has been investigated in terms of molecular- and meso -scale regularity by in-situ synchrotron grazing-incidence small-angle and wide-angle X-ray scattering measurements.

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Various aspects of the application of the Scherrer formula to grain-size analysis in thin films of soft materials are discussed within the methodology of grazing-incidence small- and wide-angle scattering and in conjunction with the use of area detectors.

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The design and performance of a novel micro-reactor in situ flow cell permitting investigation of model catalysts with grazing-incidence small- and wide-angle X-ray scattering is presented.

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The use of an in-vacuum CCD detector to accomplish simultaneous SAXS and WAXS measurements in both transmission and grazing incident geometries is described.
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