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Search query: thin films

2057 articles match your search "thin films"

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This X-ray diffraction study proves that two α polymorphs of copper pthalocyanine (CuPc) co-exist in vacuum-deposited thin films and provides possible molecular configurations by excluded-volume considerations. Furthermore, atomic force microscopy images together with a simple MATLAB simulation show that elevated substrate temperatures facilitate the downward diffusion of CuPc molecules during film growth and lead to a smoother surface.

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Diffuse X-ray scattering is used to characterize the time dependence of the liquid phase emerging from femtosecond laser-induced melting of polycrystalline gold thin films using an XFEL. Its structure factor and partial pair distribution function confirm the liquid origin of the diffuse scattering. The liquid fraction increases with a characteristic rise-time of 13 ps.

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Grazing-incidence total X-ray scattering allows for orientational pair distribution function analysis of indium oxide thin films with only a single measurement. Elucidation of information such as effects of film anisotropy on bond lengths in specific orientations relative to the substrate and determination of orientation in X-ray amorphous films is demonstrated.

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Lamellar thin films are an important class of soft materials. For such systems, grazing-incidence scattering with an area detector close to the incident plane is simulated.

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The effect of substrate temperature, growth rate and film thickness on the crystallographic characteristics of polycrystalline Bi thin films by molecular beam epitaxy and semimetal–semiconductor transition are discussed. Meanwhile, a structure-zone model and a two-transport-channels model are introduced to explain the crystal growth characteristics and the semimetal–semiconductor transition.

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The residual stress and piezoelectric performance of ZnO thin films under different annealing parameters are investigated. The amplitudes of the sample vibrations at different frequencies are measured by a pressure electron microscope.

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It is shown how normal-incidence X-ray total scattering can be used to obtain high-quality pair distribution functions from amorphous and crystalline thin films on much thicker substrates, allowing a range of studies of the local structure in film materials.

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A computational method that directly translates the scattering peak information to crystalline domain shapes and orientations is presented. The method is demonstrated at a synchrotron beamline with a standard X-ray scattering setup.

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Electron diffraction is used to obtain accurate structural parameters from thin films by taking into account the presence of twinning.
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