issue contents

ISSN: 2053-2733

January 1995 issue

Highlighted illustration

Cover illustration: Imaging-plate recording of crystal truncation rod (CTR) scattering from an Si(111) wafer taken by oscillating the sample over an angular range of ± 4.9 ° perpendicular to <111>. Courtesy of T. Shimura and J. Harada, Photon Factory, Japan.

international union of crystallography

Acta Cryst. (1995). A51, 1-6
doi: 10.1107/S0108767395099995

research papers

Acta Cryst. (1995). A51, 20-27
doi: 10.1107/S0108767394005088

Acta Cryst. (1995). A51, 33-38
doi: 10.1107/S0108767394005726

Acta Cryst. (1995). A51, 38-47
doi: 10.1107/S0108767394006720

Acta Cryst. (1995). A51, 47-53
doi: 10.1107/S0108767394006173

Acta Cryst. (1995). A51, 53-60
doi: 10.1107/S0108767394006653

Acta Cryst. (1995). A51, 60-69
doi: 10.1107/S0108767394007440

Acta Cryst. (1995). A51, 81-87
doi: 10.1107/S0108767394006914

Acta Cryst. (1995). A51, 87-91
doi: 10.1107/S0108767394007750

short communications

books received

Acta Cryst. (1995). A51, 94
doi: 10.1107/S0108767395099983
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