issue contents

ISSN: 2053-2733

March 1995 issue

Highlighted illustration

Cover illustration: Imaging-plate recording of crystal truncation rod (CTR) scattering from an Si(111) wafer taken by oscillating the sample over an angular range of ± 4.9 ° perpendicular to <111>. Courtesy of T. Shimura and J. Harada, Photon Factory, Japan.

research papers

short communications

Acta Cryst. (1995). A51, 198
doi: 10.1107/S010876739401319X

international union of crystallography

Acta Cryst. (1995). A51, 203
doi: 10.1107/S0108767395099971

book reviews

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