issue contents

ISSN: 2053-2733

May 1995 issue

Highlighted illustration

Cover illustration: Imaging-plate recording of crystal truncation rod (CTR) scattering from an Si(111) wafer taken by oscillating the sample over an angular range of ± 4.9 ° perpendicular to <111>. Courtesy of T. Shimura and J. Harada, Photon Factory, Japan.

lead articles

research papers

short communications

international union of crystallography

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