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Volume 59 
Part 2 
Page 199  
March 2003  

Received 7 January 2003
Accepted 24 January 2003


[Cited in]

© International Union of Crystallography 2003

A new method for calculation of crystal susceptibilities for X-ray diffraction at arbitrary wavelength. Erratum

I. D. Feranchuk,a L. I. Gurskii,a L. I. Komarov,a+ O. M. Lugovskaya,a F. Burgäzyb and A. Ulyanenkovb*

aByelorussian State University, F. Skariny Av. 4, 220050 Minsk, Republic of Belarus, and bBruker AXS, Östl. Rheinbrückenstrasse 50, 76187 Karlsruhe, Germany
Correspondence e-mail: alex.ulyanenkov@bruker-axs.de

In the paper by Feranchuk, Gurskii, Komarov, Lugovskaya, Burgäzy & Ulyanenkov [Acta Cryst. (2002)[Feranchuk, I. D., Gurskii, L. I., Komarov, L. I., Lugovskaya, O. M., Burgäzy, F. & Ulyanenkov, A. (2002). Acta Cryst. A58, 370-384.]. A58, 370-384 ], there is a misprint in equation (22) : instead of parameter s, the normalized parameter s1 = 4[pi]a0s has to be used, where a0 = 0.529177  Å is a Bohr radius. The conclusions and other results are correct.

Keywords: susceptibility; atomic scattering factor; Debye-Waller factor.

References

Feranchuk, I. D., Gurskii, L. I., Komarov, L. I., Lugovskaya, O. M., Burgäzy, F. & Ulyanenkov, A. (2002). Acta Cryst. A58, 370-384.

Acta Cryst (2003). A59, 199  [ doi:10.1107/S0108767303002216 ]