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Cover illustration: Determination of a one-dimensional structure by the charge flipping algorithm. Bottom curves: grey is the initial electron density obtained with a random choice of structure-factor phases; white is the result of charge flipping, i.e. the sign of the density below a threshold is reversed. Top curves: electron density after convergence (blue) and its flipped counterpart (red). Only the three atomic regions correspond to the true structure, small oscillations do not. See Oszlányi & Süto [Acta Cryst. (2004), A60, 134-141; (2005), A61, 147-152]. |
Acta Cryst. (2006). A62, 1-10 [ doi:10.1107/S0108767305036111 ] X-ray diffraction by a crystal in a permanent external electric field: electric-field-induced structural response in
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Acta Cryst. (2006). A62, 11-20 [ doi:10.1107/S0108767305037657 ] Reciprocal-space mapping of epitaxic thin films with crystallite size and shape polydispersityA. Boulle, F. Conchon and R. GuinebretièreSynopsis: A development is presented that allows the simulation of reciprocal-space maps of epitaxic thin films exhibiting fluctuations in the size and shape of the crystalline domains over which diffraction is coherent. In all cases considered, the computation of the reciprocal-space map only requires a two-dimensional Fourier integral and the integrand has a simple analytical expression. Online 22 December 2005 |
Acta Cryst. (2006). A62, 21-40 [ doi:10.1107/S010876730503686X ] Groupoid of orientational variantsC. CayronSynopsis: The orientational variants generated by twinning, precipitation or phase transition are algebraically described by a groupoid theory. Online 22 December 2005 |
Acta Cryst. (2006). A62, 41-46 [ doi:10.1107/S0108767305040158 ] Notes for authors 2006Online 22 December 2005 |
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