Digital electron diffraction – seeing the whole picture

Beanland, R.; Thomas, P.J.; Woodward, D.I.; Thomas, P.A.; Roemer, R.A.

doi:10.1107/S0108767313010143

Acta Crystallographica Section A
Acta Crystallographica
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Figure 2
(a) Sixteen CBED patterns from [110] silicon with varying beam tilts. The 000 (red), 111 (blue) and 220 (yellow) beams are highlighted in each. (b) Digital reconstruction of LACBED patterns from many individual CBED patterns, highlighting the components from the patterns in (a). (c) The on-axis CBED pattern.

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ISSN: 2053-2733

Volume 69| Part 4| May 2013| Pages 427-434

doi:10.1107/S0108767313010143

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