Figure 5
(a), (b) Visualizations of the central part of the reconstructed complex probe fields of data set 1 and data set 2, respectively. (c) Intensity of a horizontal slice through the probe at the sample [dashed white line in (a)]. (d) Intensity of a vertical slice through the probe at the sample [dash-dotted white line in (a)]. Gaussian fits (red lines) yield FWHM values of 673 nm × 564 nm (h × v). (e) Intensity of a horizontal slice through the probe at the sample [dashed white line in (b)]. (f) Intensity of a vertical slice through the probe at the sample [dash-dotted white line in (b)]. Gaussian fits (red lines) yield FWHM values of 580 nm × 566 nm (h × v). (g), (h) Intensity of numerically propagated probe fields as a slice through the optical axis and the horizontal axis [indicated as a dashed white line in (a), (b)] of the focus (at [z\,\,\gtrsim\,\,]2 mm) of data sets 1 and 2, respectively. Dashed white lines, dashed black lines and dash-dotted white lines indicate the plane of the pinhole, position of the sample and position of the focal plane, respectively. Scale bars denote 0.5 µm in (a) and (b).  [article HTML]