Statistical analysis of multipole-model-derived structural parameters and charge-density properties from high-resolution X-ray diffraction experiments

Kamiński, R.; Domagała, S.; Jarzembska, K.N.; Hoser, A.A.; Sanjuan-Szklarz, W.F.; Gutmann, M.J.; Makal, A.; Malińska, M.; Bąk, J.M.; Wozńiak, K.

doi:10.1107/S2053273313028313

Acta Crystallographica Section A
Acta Crystallographica
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Figure 7
Sample means and sample standard deviations evaluated at each point of the C1—O1 bond path for (a) electron density (green solid line) and (b) its Laplacian (blue solid line). Error bars (red vertical lines) are shown at the 3σ and 1σ levels for (a) and (b) panels, respectively.

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ISSN: 2053-2733

Volume 70| Part 1| December 2014| Pages 72-91

doi:10.1107/S2053273313028313

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