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Figure 16
(a) The simulated scattering within the instrument capture volume for 10 µm crystallites at the exact Bragg condition within the Bragg–Brentano geometry (Si 220 reflection) with no instrumental aberrations or diffuse scattering. (b) The simulated profile (including instrumental aberrations from the geometry given in the caption to Fig. 15[link]) with increasing levels of diffuse scattering, a, b, c, d, that correspond to the ratios of the peak in the diffuse scatter to the kinematical maximum of 0, 0.1, 0.5 and 0.75, respectively. The barely observable double line for each corresponds to transmission (lower line) and reflection (upper line) dynamical contributions. (c) The residual dynamical contributions for the Bragg–Brentano geometry described in the text; the intensities are given for the geometric average of the reflection and transmission geometries, with the dashed line for conventional theory (ac, bc, cc, dc) and the solid line for the new theory (a, b, c, d), where the fractions correspond to those in (b).

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ISSN: 2053-2733
Volume 70| Part 3| March 2014| Pages 257-282
doi:10.1107/S205327331400117X
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