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Figure 20
(a) The distribution of intensity around the Debye–Scherrer ring (Si 220 Cu Kα1) obtained with a double pinhole (divergence ∼0.1°) and a two-dimensional detector (PIXcel) by scanning in ω and 2θ coupled together, versus ω. (b) The calculated intensity distribution from 10 000 randomly orientated crystallites captured in 2θ and offsetting in χ. Both geometries are alternative ways of investigating the Debye–Scherrer ring, the former was to achieve controllable high-resolution data. Both images are plotted on a linear scale and follow similar distributions.

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ISSN: 2053-2733
Volume 70| Part 3| March 2014| Pages 257-282
doi:10.1107/S205327331400117X
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