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Figure 9
(a) The instrument capture area for a spherical crystallite in the plane normal to the crystal plane tilt, i.e. for X = 0. The integration steps, in Ω and 2θ, are inclined with corners of the area defined by (sxi, szi), where i = 1, 2, 3, 4. (b) gives the variation in this capture area as a function of 2θ (points; calculated from random values of Ω) and the Lorentz function 1/sin 2θ (line). S is the diffraction vector that defines the area in reciprocal space for an incident-beam vector of k0 and a detected-beam direction defined by the vector kH.

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