Acta Crystallographica Section B

Structural Science

Volume 60, Part 4 (August 2004)

Acta Cryst. (2004). B60, 388-405    [doi:10.1107/S010876810401393X]

Synchrotron X-ray and ab initio studies of -Si₃N₄

D. du Boulay, N. Ishizawa, T. Atake, V. Streltsov, K. Furuya and F. Munakata

Abstract: Almost absorption- and extinction-free single-crystal synchrotron X-ray diffraction data were measured at 150, 200 and 295  K for -Si₃N₄, silicon nitride, at a wavelength of 0.7  Å. The true symmetry of this material has been the subject of minor controversy for several decades. No compelling evidence favouring the low-symmetry P6₃ model was identified in this study.

Online 19 July 2004

	Structure factor file (CIF format) (32.3 kbytes) Contains datablock 295K-C
	Structure factor file (CIF format) (35.1 kbytes) Contains datablock 200K-C
	Structure factor file (CIF format) (32.3 kbytes) Contains datablock 150K-C

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