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Figure 3
Scattered X-ray intensities of γ-Sb2O3 under ambient conditions as a function of diffraction angle 2θ. The observed pattern (diamonds) measured in Debye–Scherrer geometry, the best Rietveld fit profiles (line) and the difference curve between the observed and the calculated profiles (below) are shown. The high-angle part starting at 9.5° 2θ is enlarged for clarity. The second phase is included as a LeBail fit.

ISSN: 2052-5206
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