Structural transformation of Sb-based high-speed phase-change material

Matsunaga, T.; Kojima, R.; Yamada, N.; Kubota, Y.; Kifune, K.

doi:10.1107/S0108768112039961

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 10
Observed (+) and calculated (gray line) X-ray diffraction profiles for Ag_3.4In_3.7Sb_76.4Te_16.5 (Sb₈₇Te₁₃ + Sb₂O₃) at 873 K by Rietveld analysis in the commensurate case (see Table 5

b1). This diffraction data were obtained in 1999 at SPring-8 (Matsunaga et al., 2001

). A difference curve (observed − calculated) appears at the top of the figure; reflection markers are indicated by vertical spikes below the diffraction patterns. Of the first line of spikes the longer ones are for the peaks of the main reflections of Sb₈₇Te₁₃, and the shorter ones are for the satellites. Those at the bottom show the peak positions for Sb₂O₃.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 68| Part 6| October 2012| Pages 559-570

doi:10.1107/S0108768112039961

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