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Figure 5
Observed (+) and calculated (gray line) X-ray diffraction profiles for AgInTe2 + Sb89Te11 at room temperature by Rietveld analysis. A difference curve (observed–calculated) appears at the top of the figure; reflection markers are indicated by vertical spikes below the diffraction patterns. Of the first line of spikes, the longer ones are for the peaks of the main reflections of Sb89Te11, and the shorter ones are for the satellites. Those at the bottom show the peak positions for AgInTe2. As seen in the figure depicted in d spacing, a few unmatched weak peaks were observed, which were presumed to be from another contaminant phase.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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