Figure 3
Experimental (2-3) and calculated (1, model) X-ray diffraction curves around 115 reflections from GaAs for the LT-GaAs samples alternately [delta]-doped with Sb and P. Curves 2 were recorded in the as-grown state. Curves 3 were taken after annealing at 873 K for 15 min. Arrows mark the positions of the SL-0 peak. The curves are shifted along the vertical axis for clarity.  [article HTML]

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