Figure 5
Experimental (2-3) and calculated (model, 1) X-ray reflectivity curves for the LT-GaAs samples alternately [delta]-doped with Sb and P. Curve 2 was recorded in the as-grown state. Curve 3 was taken after annealing at 873 K for 15 min. The curves are shifted along the vertical axis for clarity.  [article HTML]

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