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Figure 5
Experimental (2–3) and calculated (model, 1) X-ray reflectivity curves for the LT-GaAs samples alternately δ-doped with Sb and P. Curve 2 was recorded in the as-grown state. Curve 3 was taken after annealing at 873 K for 15 min. The curves are shifted along the vertical axis for clarity.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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