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Figure 6
Dark field TEM image (g = 002) of (a) the as-grown and (b) annealed samples with the combined δ-Sb and δ-P. White and black arrows mark the positions of Sb and P δ-layers, respectively.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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