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Figure 6
Measured (left) and calculated diffuse scattering (right) of the disordered single-crystal sample of the hP386-Al57.4Cu3.6Ta39.0 structure. The shown reflections correspond to the reconstruction of the h5l plane of the reciprocal space pattern. Some additional reflections are due to an additional crystalline individual in the sample. The insert shows an enlarged part of the diffraction pattern for better visibility of the diffuse streaks.

ISSN: 2052-5206
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