Figure 1 25  500 partial reflection intensities and average integrated background scattering in the diffraction image of an OP crystal [0.25° rotation, 15  s exposure time (1012 photons), 0.25 × 0.25 × 0.25  mm crystal size, 0.3 × 0.3  mm slit size] as a function of resolution. The background variance component arising from detector noise is also shown.

© International Union of Crystallography 2006