view article

Figure 1
Wide-sliced and fine-sliced data collection. The background and the reflection intensity along φ, assuming a Gaussian distribution of the reflection intensity with σφ = 0.05°, are shown. The reflecting range ξ, FWHM and σφ of the reflection are indicated. (a) Wide-sliced data collection with a rotation width of 1°. The intensity of a full reflection (green outline) is recorded on a single image without sampling of the profile along φ. A large amount of background overlaps with the reflection intensity along φ and is included in the integration. A partial reflection (orange outline) is recorded on two consecutive images with twice the background of a full reflection. (b) Intermediate fine-slicing at Δφ = 2σφ = 0.1°: improved background separation and coarse sampling of the profile along φ. (c) Fine-slicing at Δφ = 0.5σφ = 0.025°. The reflection profile is densely sampled along φ. The inclusion of φ regions which contain background but no parts of the reflection profile and intensity in the integration is further reduced.

Journal logoSTRUCTURAL
ISSN: 2059-7983
Follow Acta Cryst. D
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds