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The crystal structure of the title compound, C16H14, was refined by Iball & Low [Acta Cryst. (1974). B30, 2203-2205] to an R value of 0.080. The present redetermination confirms the previous study but with improved precision and with all H atoms located and refined. The atoms of the methyl group are disordered over two sites with occupancies 0.55 (3) and 0.45 (3). The mol­ecular symmetry is Ci. The crystal structure is stabilized by van der Waals inter­actions.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807027511/kp2114sup1.cif
Contains datablocks global, I

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807027511/kp2114Isup2.hkl
Contains datablock I

CCDC reference: 654932

Key indicators

  • Single-crystal X-ray study
  • T = 290 K
  • Mean [sigma](C-C) = 0.002 Å
  • R factor = 0.045
  • wR factor = 0.137
  • Data-to-parameter ratio = 10.8

checkCIF/PLATON results

No syntax errors found



Alert level C PLAT390_ALERT_3_C Deviating Methyl C8 X-C-H Bond Angle ...... 117.00 Deg.
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 1 ALERT level C = Check and explain 0 ALERT level G = General alerts; check 0 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 0 ALERT type 2 Indicator that the structure model may be wrong or deficient 1 ALERT type 3 Indicator that the structure quality may be low 0 ALERT type 4 Improvement, methodology, query or suggestion 0 ALERT type 5 Informative message, check

Comment top

In the literature, there is a single paper related to the crystal structure of 9,10-dimethylanthracene (I) [Iball & Low, 1974; CSD refcode DMANTR (Cambridge Structural Database, Version 5.28; Allen, 2002)]. In that determination, a reliability factor was R=0.080 for 712 data, and hydrogen atom coordinates were included in calculated positions without any refinement. However, the redetermination of (I) from recollected intensity data is presented here. The disorder of methyl group was detected over two sites (Fig. 1) with site occupancy factors 0.55 (3) and 0.45 (3). Apart from this disorder and the higher precision of the geometric parameters [σ(C—C) = 0.002–0.003 Å in the present work, compared with 0.009–0.012 Å in the earlier work (Iball & Low, 1974)], the results obtained agree well with the already published data. In the crystal structure of (I) the asymmetric unit consists of a half-molecule whereas the other half is generated by a centre of inversion. The molecule is planar with the largest r.m.s. deviation from the best least-square plane being 0.005 (1) Å for C5. The crystal packing is stabilized by van der Waals interactions (Fig. 2).

Related literature top

For the previous structure determination, see: Iball & Low (1974) [refcode DMANTR, Cambridge Structural Database, Version 5.28; Allen, 2002)].

Experimental top

The crystals of (I) were obtained from the vapour in a specially constructed glass apparatus consisting of the two main parts, namely a cold copper plate used as a substrate and an electrically heated molybdenic boat, both equipped with the Fe/constantan thermocouples which allowed an independent control of the T1 and T2 temperatures of these parts, respectively. Under a low background pressure of 10-3 mbar, the crystals were nucleated at 311 K/330 K (T1/T2) and grown at 318 K /330 K.

Refinement top

All C-bound H atoms, except those on C8 atom were included in the refinement at the geometrically calculated positions and refined using a riding model with C—H distances of 0.93 Å and with Uiso(H)=1.2Ueq(C). The H atoms of methyl group were located in a difference Fourier map and refined with Uiso(H)=1.5Ueq(C). These atoms were found to be disordered over two sites with refined occupancies of 0.55 (3): 0.45 (3).

Structure description top

In the literature, there is a single paper related to the crystal structure of 9,10-dimethylanthracene (I) [Iball & Low, 1974; CSD refcode DMANTR (Cambridge Structural Database, Version 5.28; Allen, 2002)]. In that determination, a reliability factor was R=0.080 for 712 data, and hydrogen atom coordinates were included in calculated positions without any refinement. However, the redetermination of (I) from recollected intensity data is presented here. The disorder of methyl group was detected over two sites (Fig. 1) with site occupancy factors 0.55 (3) and 0.45 (3). Apart from this disorder and the higher precision of the geometric parameters [σ(C—C) = 0.002–0.003 Å in the present work, compared with 0.009–0.012 Å in the earlier work (Iball & Low, 1974)], the results obtained agree well with the already published data. In the crystal structure of (I) the asymmetric unit consists of a half-molecule whereas the other half is generated by a centre of inversion. The molecule is planar with the largest r.m.s. deviation from the best least-square plane being 0.005 (1) Å for C5. The crystal packing is stabilized by van der Waals interactions (Fig. 2).

For the previous structure determination, see: Iball & Low (1974) [refcode DMANTR, Cambridge Structural Database, Version 5.28; Allen, 2002)].

Computing details top

Data collection: CrysAlis CCD (Oxford Diffraction, 2007); cell refinement: CrysAlis RED (Oxford Diffraction, 2007); data reduction: CrysAlis RED; program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: PLATON (Spek, 2003) and DIAMOND (Brandenburg, 2006); software used to prepare material for publication: SHELXL97.

Figures top
[Figure 1] Fig. 1. View of molecule of (I) showing the atom-numbering scheme and disordered H atoms of methyl group. Displacement ellipsoids are drawn at the 20% probability level and H atoms are shown as small spheres of arbitrary radii. Symetry code (a): 1 - x, -y, 1 - z.
[Figure 2] Fig. 2. The crystal packing, viewed along the a axis.
9,10-dimethylanthracene top
Crystal data top
C16H14F(000) = 220
Mr = 206.27Dx = 1.228 Mg m3
Monoclinic, P21/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ybcCell parameters from 3013 reflections
a = 7.8229 (6) Åθ = 2.6–25.4°
b = 5.3093 (4) ŵ = 0.07 mm1
c = 13.4649 (10) ÅT = 290 K
β = 93.861 (7)°Columnar, yellow
V = 557.98 (7) Å30.50 × 0.16 × 0.04 mm
Z = 2
Data collection top
Oxford Diffraction Xcalibur3 CCD
diffractometer
1003 independent reflections
Radiation source: fine-focus sealed tube692 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.020
ω scansθmax = 25.4°, θmin = 2.6°
Absorption correction: analytical
(CrysAlis RED; Oxford Diffraction, 2007)
h = 99
Tmin = 0.947, Tmax = 0.994k = 36
3013 measured reflectionsl = 1616
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.046H atoms treated by a mixture of independent and constrained refinement
wR(F2) = 0.137 w = 1/[σ2(Fo2) + (0.0784P)2 + 0.0148P]
where P = (Fo2 + 2Fc2)/3
S = 1.11(Δ/σ)max < 0.001
1003 reflectionsΔρmax = 0.17 e Å3
93 parametersΔρmin = 0.17 e Å3
0 restraintsExtinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.13 (2)
Crystal data top
C16H14V = 557.98 (7) Å3
Mr = 206.27Z = 2
Monoclinic, P21/cMo Kα radiation
a = 7.8229 (6) ŵ = 0.07 mm1
b = 5.3093 (4) ÅT = 290 K
c = 13.4649 (10) Å0.50 × 0.16 × 0.04 mm
β = 93.861 (7)°
Data collection top
Oxford Diffraction Xcalibur3 CCD
diffractometer
1003 independent reflections
Absorption correction: analytical
(CrysAlis RED; Oxford Diffraction, 2007)
692 reflections with I > 2σ(I)
Tmin = 0.947, Tmax = 0.994Rint = 0.020
3013 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0460 restraints
wR(F2) = 0.137H atoms treated by a mixture of independent and constrained refinement
S = 1.11Δρmax = 0.17 e Å3
1003 reflectionsΔρmin = 0.17 e Å3
93 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/UeqOcc. (<1)
C10.1584 (2)0.1546 (3)0.30410 (13)0.0641 (5)
H10.05500.15030.26570.077*
C20.1862 (2)0.0076 (3)0.38108 (13)0.0571 (5)
H20.10080.12220.39440.069*
C30.34228 (18)0.0089 (2)0.44254 (10)0.0464 (5)
C40.62951 (19)0.1785 (2)0.47711 (11)0.0468 (5)
C50.47336 (19)0.1693 (2)0.41972 (10)0.0464 (5)
C60.4366 (2)0.3365 (3)0.33742 (12)0.0580 (5)
H60.51910.45330.32160.070*
C70.2856 (2)0.3297 (3)0.28208 (13)0.0649 (6)
H70.26580.44120.22930.078*
C80.7676 (3)0.3651 (4)0.45414 (18)0.0626 (6)
H8A0.798 (6)0.474 (9)0.514 (4)0.094*0.55 (3)
H8B0.732 (7)0.460 (10)0.402 (4)0.094*0.55 (3)
H8C0.871 (7)0.268 (9)0.440 (4)0.094*0.55 (3)
H8D0.801 (8)0.352 (10)0.379 (5)0.094*0.45 (3)
H8E0.876 (9)0.355 (11)0.495 (4)0.094*0.45 (3)
H8F0.732 (8)0.540 (11)0.449 (5)0.094*0.45 (3)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
C10.0578 (11)0.0703 (11)0.0630 (11)0.0084 (9)0.0039 (9)0.0041 (9)
C20.0506 (9)0.0576 (10)0.0629 (10)0.0015 (7)0.0020 (8)0.0076 (8)
C30.0471 (9)0.0439 (8)0.0487 (9)0.0016 (6)0.0077 (7)0.0091 (6)
C40.0459 (9)0.0446 (8)0.0511 (9)0.0023 (6)0.0116 (7)0.0077 (6)
C50.0507 (9)0.0422 (8)0.0476 (8)0.0021 (6)0.0126 (7)0.0057 (6)
C60.0615 (11)0.0539 (10)0.0596 (10)0.0013 (7)0.0109 (8)0.0031 (7)
C70.0689 (12)0.0666 (11)0.0592 (10)0.0119 (9)0.0048 (9)0.0048 (8)
C80.0575 (11)0.0609 (11)0.0699 (13)0.0118 (9)0.0093 (10)0.0028 (10)
Geometric parameters (Å, º) top
C1—C21.354 (2)C6—C71.355 (2)
C1—C71.408 (3)C6—H60.9300
C1—H10.9300C7—H70.9300
C2—C31.428 (2)C8—H8A1.00 (5)
C2—H20.9300C8—H8B0.90 (5)
C3—C4i1.414 (2)C8—H8C0.99 (5)
C3—C51.443 (2)C8—H8D1.07 (6)
C4—C51.402 (2)C8—H8E0.98 (6)
C4—C81.513 (2)C8—H8F0.97 (6)
C5—C61.434 (2)
C2—C1—C7120.1 (2)C4—C8—H8A110 (2)
C2—C1—H1119.9C4—C8—H8B110 (3)
C7—C1—H1119.9H8A—C8—H8B110 (4)
C1—C2—C3122.3 (2)C4—C8—H8C108 (3)
C1—C2—H2118.9H8A—C8—H8C108 (4)
C3—C2—H2118.9H8B—C8—H8C111 (4)
C4i—C3—C2122.0 (1)C4—C8—H8D112 (3)
C4i—C3—C5120.3 (1)H8A—C8—H8D137 (4)
C2—C3—C5117.7 (1)H8B—C8—H8D51 (3)
C5—C4—C3i119.0 (1)H8C—C8—H8D62 (3)
C5—C4—C8121.2 (2)C4—C8—H8E117 (3)
C3i—C4—C8119.8 (2)H8A—C8—H8E55 (3)
C4—C5—C6121.7 (1)H8B—C8—H8E133 (4)
C4—C5—C3120.7 (1)H8C—C8—H8E53 (3)
C6—C5—C3117.5 (2)H8D—C8—H8E106 (4)
C7—C6—C5122.0 (2)C4—C8—H8F116 (3)
C7—C6—H6119.0H8A—C8—H8F63 (3)
C5—C6—H6119.0H8B—C8—H8F48 (4)
C6—C7—C1120.3 (2)H8C—C8—H8F136 (4)
C6—C7—H7119.8H8D—C8—H8F95 (4)
C1—C7—H7119.8H8E—C8—H8F109 (4)
C7—C1—C2—C30.1 (2)C2—C3—C5—C4179.9 (1)
C1—C2—C3—C4i179.9 (1)C4i—C3—C5—C6179.9 (1)
C1—C2—C3—C50.5 (2)C2—C3—C5—C60.6 (2)
C3i—C4—C5—C6179.8 (1)C4—C5—C6—C7179.6 (1)
C8—C4—C5—C60.5 (2)C3—C5—C6—C70.2 (2)
C3i—C4—C5—C30.5 (2)C5—C6—C7—C10.2 (3)
C8—C4—C5—C3179.8 (2)C2—C1—C7—C60.2 (3)
C4i—C3—C5—C40.5 (2)
Symmetry code: (i) x+1, y, z+1.

Experimental details

Crystal data
Chemical formulaC16H14
Mr206.27
Crystal system, space groupMonoclinic, P21/c
Temperature (K)290
a, b, c (Å)7.8229 (6), 5.3093 (4), 13.4649 (10)
β (°) 93.861 (7)
V3)557.98 (7)
Z2
Radiation typeMo Kα
µ (mm1)0.07
Crystal size (mm)0.50 × 0.16 × 0.04
Data collection
DiffractometerOxford Diffraction Xcalibur3 CCD
Absorption correctionAnalytical
(CrysAlis RED; Oxford Diffraction, 2007)
Tmin, Tmax0.947, 0.994
No. of measured, independent and
observed [I > 2σ(I)] reflections
3013, 1003, 692
Rint0.020
(sin θ/λ)max1)0.602
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.046, 0.137, 1.11
No. of reflections1003
No. of parameters93
H-atom treatmentH atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å3)0.17, 0.17

Computer programs: CrysAlis CCD (Oxford Diffraction, 2007), CrysAlis RED (Oxford Diffraction, 2007), CrysAlis RED, SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), PLATON (Spek, 2003) and DIAMOND (Brandenburg, 2006), SHELXL97.

 

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