supplementary materials


Acta Cryst. (2007). E63, o3356    [ doi:10.1107/S1600536807031170 ]

3,4-Diaminopyridinium hydrogen squarate

B. Koleva, T. Tsanev, T. Kolev, H. Mayer-Figge and W. S. Sheldrick

Abstract top

Anions and cations of the title compound, C5H8N3+·C4HO4-, are connected by moderately strong intermolecular N-H...O hydrogen bonds into an infinite three-dimensional network. Hydrogen squarate anions form dimers through strong O-H...O interactions.

Comment top

In the course of our spectroscopic and structural studies of pyridine derivatives (Kolev et al., 2004; Kolev, Wortmann et al.,2005; Kolev, Fiser et al., 2005; Kolev et al., 2007), the crystal structure of 3,4-diaminopyridinium hydrogensquarate is reported. Its molecular structure is depicted in Fig. 1. The crystal structure consists of chains of cations and anions connected by moderate hydrogen bonds (Fig. 2) with N···O lengths of 2.799 (4), 2.972 (4) and 2.973 (4) Å, respectively. Hydrogensquarate anions are linked into centrosymmetric dimers by strong O—H···O [O···O = 2.539 (3) Å] interactions.

Related literature top

For related literature, see: Kolev et al. (2004, 2007); Kolev, Fiser et al. (2005); Kolev, Wortmann et al. (2005).

Experimental top

3,4-diaminopyridinium hydrogensquarate was obtained by mixing an equimolar ratio of 3,4-diaminopyridine (Merck) and squaric acid (Sigma-Aldrich) in 10 ml e thanol. Suitable crystals for X-ray analysis, were grown by allowing the solution to slowly evaporate for 10 days, and were subsequently filtered off, washed with methanol and dried under air.

Refinement top

H atoms were constrained to idealized positions and refined using a riding model, with C—H distances of 0.93 Å [Uiso(H) = 1.2 Uiso(C)], NH distances of 0.86 Å [Uiso(H) = 1.5 Uiso(N) and O—H distances of 0.82 Å [Uiso(H) = 1.5 Uiso(O)].

Computing details top

Data collection: R3m/V (Siemens, 1989); cell refinement: R3m/V; data reduction: XDISK (Siemens, 1989); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: SHELXTL-Plus (Sheldrick, 1995); software used to prepare material for publication: SHELXL97.

Figures top
[Figure 1] Fig. 1. The molecular structure of (I), showing the atom-labelling scheme. Displacement ellipsoids are drawn at the 50% probability level.
[Figure 2] Fig. 2. Hydrogen bonding between the anions and cations of (I).
3,4-Diaminopyridinium hydrogen squarate top
Crystal data top
C5H8N3+·C4HO4F(000) = 464
Mr = 223.19Dx = 1.529 Mg m3
Monoclinic, P21/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -P 2ybcCell parameters from 27 reflections
a = 10.069 (2) Åθ = 7.5–15°
b = 7.1925 (14) ŵ = 0.12 mm1
c = 13.480 (3) ÅT = 294 K
β = 96.56 (3)°Prsim, colourless
V = 969.8 (3) Å30.58 × 0.48 × 0.46 mm
Z = 4
Data collection top
Siemens P4 four-circle
diffractometer
1172 reflections with I > 2σ(I)
Radiation source: fine-focus sealed tubeRint = 0.044
graphiteθmax = 25.0°, θmin = 2.0°
ω scansh = 111
Absorption correction: ψ scan
(XPREP; Sheldrick, 1995)
k = 18
Tmin = 0.844, Tmax = 0.938l = 1616
2310 measured reflections3 standard reflections every 100 reflections
1698 independent reflections intensity decay: 1%
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.066Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.189H-atom parameters constrained
S = 1.09 w = 1/[σ2(Fo2) + (0.0946P)2 + 0.5492P]
where P = (Fo2 + 2Fc2)/3
1698 reflections(Δ/σ)max = 0.001
154 parametersΔρmax = 0.24 e Å3
0 restraintsΔρmin = 0.37 e Å3
Crystal data top
C5H8N3+·C4HO4V = 969.8 (3) Å3
Mr = 223.19Z = 4
Monoclinic, P21/cMo Kα radiation
a = 10.069 (2) ŵ = 0.12 mm1
b = 7.1925 (14) ÅT = 294 K
c = 13.480 (3) Å0.58 × 0.48 × 0.46 mm
β = 96.56 (3)°
Data collection top
Siemens P4 four-circle
diffractometer
1172 reflections with I > 2σ(I)
Absorption correction: ψ scan
(XPREP; Sheldrick, 1995)
Rint = 0.044
Tmin = 0.844, Tmax = 0.938θmax = 25.0°
2310 measured reflections3 standard reflections every 100 reflections
1698 independent reflections intensity decay: 1%
Refinement top
R[F2 > 2σ(F2)] = 0.066H-atom parameters constrained
wR(F2) = 0.189Δρmax = 0.24 e Å3
S = 1.09Δρmin = 0.37 e Å3
1698 reflectionsAbsolute structure: ?
154 parametersFlack parameter: ?
0 restraintsRogers parameter: ?
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
N10.7328 (3)0.3740 (5)1.0145 (2)0.0559 (9)
H10.65860.39901.03750.067*
C20.8249 (3)0.2759 (5)1.0705 (3)0.0520 (9)
H20.80860.23681.13380.062*
C30.9425 (3)0.2325 (5)1.0359 (2)0.0472 (9)
H31.00570.16241.07540.057*
N21.0874 (2)0.2506 (4)0.9064 (2)0.0498 (8)
H211.10310.28650.84800.060*
H221.14650.18770.94340.060*
C40.9699 (3)0.2929 (5)0.9401 (2)0.0400 (8)
N30.8886 (3)0.4537 (5)0.7857 (2)0.0568 (9)
H310.82700.51500.75030.068*
H320.96200.42770.76190.068*
C50.8693 (3)0.3965 (5)0.8816 (2)0.0403 (8)
C60.7522 (3)0.4362 (5)0.9219 (3)0.0511 (9)
H60.68600.50610.88540.061*
C1'0.2926 (3)0.0429 (5)0.2041 (2)0.0429 (8)
O1'0.1804 (2)0.0879 (4)0.22347 (18)0.0579 (8)
C2'0.3618 (3)0.0417 (5)0.1124 (2)0.0417 (8)
O2'0.3283 (2)0.0894 (4)0.02326 (16)0.0519 (7)
C3'0.4780 (3)0.0317 (5)0.1697 (2)0.0414 (8)
O3'0.5998 (2)0.0799 (4)0.15119 (17)0.0576 (8)
H3'0.60300.08140.09070.086*
C4'0.4173 (3)0.0327 (5)0.2619 (3)0.0465 (9)
O4'0.4548 (2)0.0753 (4)0.34977 (18)0.0589 (8)
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
N10.0358 (14)0.072 (2)0.062 (2)0.0045 (15)0.0139 (13)0.0134 (18)
C20.049 (2)0.060 (2)0.048 (2)0.0107 (18)0.0109 (16)0.0025 (18)
C30.0440 (17)0.052 (2)0.0449 (19)0.0018 (16)0.0021 (14)0.0001 (17)
N20.0357 (14)0.063 (2)0.0504 (17)0.0070 (13)0.0061 (12)0.0012 (15)
C40.0335 (15)0.0413 (18)0.0444 (18)0.0026 (14)0.0012 (13)0.0080 (15)
N30.0509 (17)0.076 (2)0.0430 (17)0.0126 (16)0.0020 (13)0.0090 (16)
C50.0364 (16)0.0447 (19)0.0389 (17)0.0023 (14)0.0003 (13)0.0048 (15)
C60.0375 (17)0.056 (2)0.058 (2)0.0015 (16)0.0040 (15)0.0087 (19)
C1'0.0296 (15)0.053 (2)0.0465 (18)0.0003 (14)0.0043 (13)0.0021 (16)
O1'0.0304 (11)0.090 (2)0.0544 (14)0.0110 (12)0.0107 (10)0.0002 (14)
C2'0.0284 (15)0.053 (2)0.0438 (18)0.0011 (14)0.0040 (13)0.0060 (16)
O2'0.0322 (11)0.0770 (18)0.0462 (14)0.0142 (11)0.0023 (9)0.0022 (13)
C3'0.0277 (14)0.056 (2)0.0415 (18)0.0034 (14)0.0076 (12)0.0001 (16)
O3'0.0303 (11)0.094 (2)0.0500 (14)0.0170 (12)0.0092 (10)0.0092 (14)
C4'0.0272 (15)0.059 (2)0.053 (2)0.0003 (15)0.0026 (14)0.0006 (18)
O4'0.0330 (12)0.095 (2)0.0495 (14)0.0065 (12)0.0070 (10)0.0134 (14)
Geometric parameters (Å, °) top
N1—C21.330 (5)N3—H320.8600
N1—C61.360 (5)C5—C61.383 (4)
N1—H10.8600C6—H60.9300
C2—C31.358 (5)C1'—O1'1.232 (4)
C2—H20.9300C1'—C2'1.486 (4)
C3—C41.420 (5)C1'—C4'1.501 (4)
C3—H30.9300C2'—O2'1.259 (4)
N2—C41.349 (4)C2'—C3'1.427 (4)
N2—H210.8600C3'—O3'1.325 (3)
N2—H220.8600C3'—C4'1.446 (4)
C4—C51.421 (4)O3'—H3'0.8200
N3—C51.391 (4)C4'—O4'1.241 (4)
N3—H310.8600
C2—N1—C6122.1 (3)C6—C5—C4118.4 (3)
C2—N1—H1118.9N3—C5—C4120.3 (3)
C6—N1—H1118.9N1—C6—C5120.7 (3)
N1—C2—C3120.4 (3)N1—C6—H6119.7
N1—C2—H2119.8C5—C6—H6119.7
C3—C2—H2119.8O1'—C1'—C2'134.9 (3)
C2—C3—C4120.7 (3)O1'—C1'—C4'135.9 (3)
C2—C3—H3119.7C2'—C1'—C4'89.2 (2)
C4—C3—H3119.7O2'—C2'—C3'137.0 (3)
C4—N2—H21120.0O2'—C2'—C1'133.8 (3)
C4—N2—H22120.0C3'—C2'—C1'89.2 (3)
H21—N2—H22120.0O3'—C3'—C2'135.6 (3)
N2—C4—C5121.9 (3)O3'—C3'—C4'130.7 (3)
N2—C4—C3120.4 (3)C2'—C3'—C4'93.8 (2)
C5—C4—C3117.7 (3)C3'—O3'—H3'109.5
C5—N3—H31120.0O4'—C4'—C3'135.2 (3)
C5—N3—H32120.0O4'—C4'—C1'136.9 (3)
H31—N3—H32120.0C3'—C4'—C1'87.9 (3)
C6—C5—N3121.3 (3)
Hydrogen-bond geometry (Å, °) top
D—H···AD—HH···AD···AD—H···A
O3'—H3'···O2'i0.821.762.539 (3)159
N2—H21···O1'ii0.862.132.972 (4)166
N1—H1···O4'iii0.862.012.799 (4)152
N2—H22···O2'iv0.862.142.973 (3)164
Symmetry codes: (i) −x+1, −y, −z; (ii) x+1, −y+1/2, z+1/2; (iii) −x+1, y+1/2, −z+3/2; (iv) x+1, y, z+1.
Table 1
Hydrogen-bond geometry (Å, °)
top
D—H···AD—HH···AD···AD—H···A
O3'—H3'···O2'i0.821.762.539 (3)159
N2—H21···O1'ii0.862.132.972 (4)166
N1—H1···O4'iii0.862.012.799 (4)152
N2—H22···O2'iv0.862.142.973 (3)164
Symmetry codes: (i) −x+1, −y, −z; (ii) x+1, −y+1/2, z+1/2; (iii) −x+1, y+1/2, −z+3/2; (iv) x+1, y, z+1.
Acknowledgements top

BK thanks the Alexander von Humboldt Foundation for a Fellowship and TK thanks the DAAD and the Alexander von Humboldt Foundation for a grant within the priority programme `Stability Pact South-Eastern Europe'.

references
References top

Kolev, T., Fiser, S. S., Spiteller, M., Sheldrick, W. S. & Mayer-Figge, H. (2005). Acta Cryst. E61, o1469–o1471.

Kolev, T., Koleva, B. B., Spassov, T., Cherneva, E., Spiteller, M., Sheldrick, W. S. & Mayer-Figge, H. (2007). J. Phys. Chem. B In the press. Update?

Kolev, T., Wortmann, R., Spiteller, M., Sheldrick, W. S. & Heller, M. (2004). Acta Cryst. E60, o956–o957.

Kolev, T., Wortmann, R., Spiteller, M., Sheldrick, W. S. & Mayer-Figge, H. (2005). Acta Cryst. E61, o1090–o1092.

Sheldrick, G. M. (1995). SHELXTL (Release 5.03 for Siemens R3 crystallographic research system). Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.

Sheldrick, G. M. (1997). SHELXS97 and SHELXL97. University of Göttingen, Germany.

Siemens (1989). R3m/V (Version 3.2). Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.