supplementary materials


Acta Cryst. (2007). E63, i179    [ doi:10.1107/S1600536807042523 ]

Redetermination of hydrogenhydrazinium dichloride

R. Kruszynski and A. Trzesowska

Abstract top

The crystal structure of the title compound, N2H62+·2Cl-, previously determined by photographic methods [Wyckoff (1923). Am. J. Sci. 5, 15-22; Donohue & Lipscomb (1947). J. Chem. Phys. 15, 115-119], has been redetermined from single-crystal data. The N and Cl atoms are located on threefold rotation axes, whereas the H atom lies in a general position. The [H6N2]2+ cations and the Cl- anions are connected via N-H...Cl hydrogen bonds forming a three-dimensional net, whereby R63(14) rings are generated.

Comment top

Hydrogenhydrazinium dichloride, or commonly hydrazine dihydrochloride, is the most excellent source of dry hydrazine for organic syntheses. It is commonly used as a reducing agent for the recovery of precious metals or in soldering fluxes for aluminium and magnesium alloys. It is also used as a polymerization catalyst and a chain extender, and is a source of a large number of derivatives, for example used in agrochemicals, pharmaceuticals, photographics, heat stabilizers, polymerization catalysts, flame-retardants, blowing agents for plastics, explosives, and dyes.

The crystal structure of the title compound has been previously determined by photographic methods (Wyckoff, 1923; Donohue & Lipscomb, 1947). The results of the present re-determination show a much higher precision and accuracy. The nitrogen and chlorine atoms are located on threefold rotation axis, whereas the hydrogen atom lies in a general position. The [H6N2]2+ cations and Cl anions are connected via N—H···Cl hydrogen bonds (Table) to a 3-D net, generating R63(14) rings (Bernstein et al., 1995). The bond lengths in the title compound (Table) are comparable to those observed for hydrazinium chloride (Sakurai & Tomiie, 1952; Chekhlov & Martynov, 1988) and hydrazine (Collin & Lipscomb, 1951), respectively.

Related literature top

For previously reported determinations of the title compound, see: Wyckoff (1923); Donohue & Lipscomb (1947). For the crystal structures of hydrazinium chloride, see: Sakurai & Tomiie (1952); Chekhlov & Martynov (1988). For the crystal structure of hydrazine, see: Collin & Lipscomb (1951). For patterns in hydrogen bonding, see: Bernstein et al. (1995).

Experimental top

Commercially available hydrogenhydrazinium dichloride (pure, Merck, CAS 5341–61-7) was recrystallized from a saturated solution of 0.2 mol/dm3 hydrochloric acid (about 2.7 g of the title compound in 1 cm3 of acid).

Refinement top

The H atom was found from a difference Fourier synthesis after four cycles of anisotropic refinement for the N and Cl atoms, and was refined freely.

Computing details top

Data collection: CrysAlis CCD (UNIL IC & Kuma, 2000); cell refinement: CrysAlis RED (UNIL IC & Kuma, 2000); data reduction: CrysAlis RED (UNIL IC & Kuma, 2000); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: XP in SHELXTL (Sheldrick, 1990) and ORTEP-3 (Farrugia 1997); software used to prepare material for publication: SHELXL97 (Sheldrick, 1997) and PLATON (Spek, 2003).

Figures top
[Figure 1] Fig. 1. The molecular structure of the title compound. Displacement ellipsoids are drawn at the 50% probability level. [Symmetry code: (i) −x + 1, −y + 1, −z.]
[Figure 2] Fig. 2. The packing of the structure units in a view approximately along [111]. Hydrogen bonds are indicated by dashed lines.
Hydrogenhydrazinium dichloride top
Crystal data top
N2H62+·2ClZ = 4
Mr = 104.97F000 = 216
Cubic, Pa3Dx = 1.429 Mg m3
Dm = 1.43 Mg m3
Dm measured by Berman density torsion balance
Hall symbol: -P 2ac 2abMo Kα radiation
λ = 0.71073 Å
a = 7.8731 (1) ÅCell parameters from 1003 reflections
b = 7.8731 (1) Åθ = 4.0–25.0º
c = 7.8731 (1) ŵ = 1.15 mm1
α = 90ºT = 291.0 (3) K
β = 90ºNeedle, colourless
γ = 90º0.37 × 0.11 × 0.11 mm
V = 488.020 (11) Å3
Data collection top
Kuma KM4 CCD
diffractometer
146 independent reflections
Radiation source: fine-focus sealed tube146 reflections with I > 2σ(I)
Monochromator: graphiteRint = 0.015
Detector resolution: 1048576 pixels mm-1θmax = 25.1º
T = 291.0(3) Kθmin = 4.5º
ω scansh = 9→9
Absorption correction: numerical
(X-RED; Stoe & Cie, 1999)
k = 9→9
Tmin = 0.837, Tmax = 0.880l = 9→9
4076 measured reflections
Refinement top
Refinement on F2Hydrogen site location: inferred from neighbouring sites
Least-squares matrix: fullAll H-atom parameters refined
R[F2 > 2σ(F2)] = 0.017  w = 1/[σ2(Fo2) + (0.0276P)2 + 0.0263P]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.044(Δ/σ)max < 0.001
S = 1.34Δρmax = 0.16 e Å3
146 reflectionsΔρmin = 0.42 e Å3
12 parametersExtinction correction: SHELXL97 (Sheldrick, 1997), Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.46 (3)
Secondary atom site location: difference Fourier map
Crystal data top
N2H62+·2Clγ = 90º
Mr = 104.97V = 488.020 (11) Å3
Cubic, Pa3Z = 4
a = 7.8731 (1) ÅMo Kα
b = 7.8731 (1) ŵ = 1.15 mm1
c = 7.8731 (1) ÅT = 291.0 (3) K
α = 90º0.37 × 0.11 × 0.11 mm
β = 90º
Data collection top
Kuma KM4 CCD
diffractometer
146 independent reflections
Absorption correction: numerical
(X-RED; Stoe & Cie, 1999)
146 reflections with I > 2σ(I)
Tmin = 0.837, Tmax = 0.880Rint = 0.015
4076 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.01712 parameters
wR(F2) = 0.044All H-atom parameters refined
S = 1.34Δρmax = 0.16 e Å3
146 reflectionsΔρmin = 0.42 e Å3
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2sigma(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R– factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Cl10.77910 (3)0.27910 (3)0.22090 (3)0.0283 (4)
N10.55244 (9)0.44756 (9)0.05244 (9)0.0254 (4)
H10.6227 (17)0.3953 (15)0.0133 (16)0.042 (3)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Cl10.0283 (4)0.0283 (4)0.0283 (4)0.00117 (8)0.00117 (8)0.00117 (8)
N10.0254 (4)0.0254 (4)0.0254 (4)0.0005 (3)0.0005 (3)0.0005 (3)
Geometric parameters (Å, °) top
N1—N1i1.4302 (10)N1—H10.862 (13)
N1i—N1—H1107.5 (9)
Symmetry codes: (i) −x+1, −y+1, −z.
Hydrogen-bond geometry (Å, °) top
D—H···AD—HH···AD···AD—H···A
N1—H1···Cl10.862 (13)2.242 (13)3.0944 (3)170.0 (12)
Selected geometric parameters (Å, °) top
N1—N1i1.4302 (10)N1—H10.862 (13)
N1i—N1—H1107.5 (9)
Symmetry codes: (i) −x+1, −y+1, −z.
Hydrogen-bond geometry (Å, °) top
D—H···AD—HH···AD···AD—H···A
N1—H1···Cl10.862 (13)2.242 (13)3.0944 (3)170.0 (12)
Acknowledgements top

This work was supported by funds allocated by the Ministry of Science and Higher Education to the Institute of General and Ecological Chemistry, Technical University of Łódź, Poland.

references
References top

Bernstein, J., Davis, R. E., Shimoni, L. & Chang, N.-L. (1995). Angew. Chem. Int. Ed. Engl. 34, 1555–1573.

Chekhlov, A. N. & Martynov, I. V. (1988). Kristallografiya, 33, 1010–1011.

Collin, R. L. & Lipscomb, W. N. (1951). Acta Cryst. 4, 10–14.

Donohue, J. & Lipscomb, W. N. (1947). J. Chem. Phys. 15, 115–119.

Farrugia, L. J. (1997). J. Appl. Cryst. 30, 565–?.

Sakurai, K. & Tomiie, Y. (1952). Acta Cryst. 5, 293–294.

Sheldrick, G. M. (1990). SHELXTL. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.

Sheldrick, G. M. (1997). SHELXS97 and SHELXL97. University of Göttingen, Germany.

Spek, A. L. (2003). J. Appl. Cryst. 36, 7–13.

Stoe & Cie (1999). X-RED. Version 1.18. Stoe & Cie GmbH, Darmstadt, Germany.

UNIL IC & Kuma (2000). CrysAlis CCD and CrysAlis RED. Versions 1.163. Kuma Diffraction Instruments GmbH, Wrocław, Poland.

Wyckoff, R. W. G. (1923). Am. J. Sci. 5, 15–22.