Acta Cryst. (2007). E63, i186  [ doi:10.1107/S160053680704812X ]

Refinement of the layered titanosilicate AM-1 from single-crystal X-ray diffraction data

S. Ferdov, U. Kolitsch, C. Lengauer, E. Tillmanns, Z. Lin and R. A. Sá Ferreira

Abstract: The structure of the layered noncentrosymmetric titanosilicate AM-1 (also known as JDF-L1, disodium titanium tetrasilicate dihydrate), Na₄Ti₂Si₈O₂₂·4H₂O, grown as small single crystals without the use of organics, has been refined from single-crystal X-ray diffraction data. The H atom has been located for the first time, and the hydrogen-bonding scheme is also characterized by IR and Raman spectroscopy. All atoms are in general positions except for the Na, the Ti, one Ti-bound O, one Si-bound O and the water O atoms (site symmetries 2, 4, 4, 2 and 2, respectively).

Online 10 October 2007

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