Download citation
Download citation
link to html
The mol­ecules of the title compound, C22H42Si4, are centrosymmetric. van der Waals inter­actions determine the crystal structure.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807050398/dn2244sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807050398/dn2244Isup2.hkl
Contains datablock I

CCDC reference: 640132

Key indicators

  • Single-crystal X-ray study
  • T = 100 K
  • Mean [sigma](C-C) = 0.002 Å
  • R factor = 0.033
  • wR factor = 0.083
  • Data-to-parameter ratio = 18.7

checkCIF/PLATON results

No syntax errors found



Alert level C PLAT222_ALERT_3_C Large Non-Solvent H Ueq(max)/Ueq(min) ... 3.44 Ratio PLAT230_ALERT_2_C Hirshfeld Test Diff for Si1 - C1A .. 6.19 su PLAT230_ALERT_2_C Hirshfeld Test Diff for Si2 - C2A .. 5.22 su PLAT720_ALERT_4_C Number of Unusual/Non-Standard Label(s) ........ 18
0 ALERT level A = In general: serious problem 0 ALERT level B = Potentially serious problem 4 ALERT level C = Check and explain 0 ALERT level G = General alerts; check 0 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 2 ALERT type 2 Indicator that the structure model may be wrong or deficient 1 ALERT type 3 Indicator that the structure quality may be low 1 ALERT type 4 Improvement, methodology, query or suggestion 0 ALERT type 5 Informative message, check

Comment top

1,1-Bis(silyl)-2-arylalkenes constitute an important class of organosilicon reagents which are currently widely used as potential intermediates in the organic and organometallic syntheses. Their use as precursors for the preparation of ketones (Inoue et al., 2002), dibromostyrenes (Pawluć et al., 2007) as well as a variety of important organosilicon intermediates such as acylsilanes (Inoue et al., 2001), epoxysilanes (Hodgson et al., 1997) silyl enol ethers (Cuadrado et al., 2004) etc, greatly stimulates their synthetic advancements. Although considerable effort has been made to the characterization of 1,1-bis(silyl)-2-arylalkenes, determination of their crystal structures remains almost unexplored. Here we report the crystal structure of 1,4-bis(2,2-bis(trimethylsilyl)ethenyl)benzene (1). To the best of our knowledge, this is the first example of structurally characterized 1,1-bis(silyl)-2-arylalkene without additional substituent in 2-position. The closest structure known contains t-butyl-Al instead of one SiMe3 group: 1,4-bis{2-di(tert-butyl)aluminium-2-trimethylsilyl-ethenyl}benzene (Uhl & Breher, 2000).

The overall conformation of the molecule 1 (Fig. 1) can be characterized by the dihedral angle between the benzene ring (planar within 0.0051 (7) Å) and approximately planar C11, C12, Si1, Si2 fragment (maximum deviation of 0.017 (1) Å); this angle is equal 51.75 (6)°.

The Si—C bonds differ in their lengths depending on the hybridization of the carbon atom; the mean values are 1.871 (4) Å for C(sp3) and 1.892 (2) Å for C(sp2). The silylethenyl substiuent changes the intraannular angles in benzene ring: the ipso angle is sharpened to 117.96 (11)°, while the neighbouring angle is widened to 121.19 (12)°.

Crystal packing (Fig. 2) is determined mainly by van der Waals interactions.

Related literature top

For related literature, see: Cuadrado et al. (2004); Hodgson et al. (1997); Inoue et al. (2001); Inoue et al. (2002); Pawluć et al. (2007); Uhl & Breher (2000).

Experimental top

A mixture consisting of 67.0 mg (0.30 mmol) of palladium(II) acetate, 157.2 mg (0.6 mmol) of triphenylphosphine, 1.70 g of silver nitrate (10 mmol), 5 mmol of 1,4-diiodobenzene, 10 mmol (1.72 g) of 1,1-bis(trimethylsilyl)ethene, 2.80 ml (20 mmol) of triethylamine and 30 ml of acetonitrile was placed in 50 ml, two-necked, round-bottomed flask equipped with a magnetic stirring bar and reflux condenser. The suspension was heated in an oil bath at 80°C for 2 h. After cooling to room temperature, the reaction mixture was added to water (50 ml) and extracted twice with 30 ml of pentane. The combined organic layers were dried (MgSO4) and the crude product obtained was then purified by column chromatography (silica gel/pentane) to give pure product. (2.01 g, 96%, white crystals) 1H NMR (CDCl3,) δ(p.p.m.): -0.01 (s, 18H, SiCH3), 0.18 (s, 18H, SiCH3), 7.12 (s, 4H, Ar), 7.72 (s, 2H, CH—). 13C NMR (CDCl3,) δ(p.p.m.): 0.5 (SiCH3), 2.1 (SiCH3), 127.4, 141.4 (Ar), 146.3 (—CH), 154.7 (>C). MS (EI) m/z (rel. int.): 418 (M+ 10%), 345 (15), 257 (10), 171 (100), 131 (10), 73 (15). HRMS calcd for C22H42Si4: 418.2363, found: 418.2348.

Refinement top

Hydrogen atoms were found in the difference Fourier maps; the positional parameters of all hydrogen atoms were freely refined, Uiso parameters for C—H H atoms were refined, for CH3 groups one common Uiso for each group was refined.

Structure description top

1,1-Bis(silyl)-2-arylalkenes constitute an important class of organosilicon reagents which are currently widely used as potential intermediates in the organic and organometallic syntheses. Their use as precursors for the preparation of ketones (Inoue et al., 2002), dibromostyrenes (Pawluć et al., 2007) as well as a variety of important organosilicon intermediates such as acylsilanes (Inoue et al., 2001), epoxysilanes (Hodgson et al., 1997) silyl enol ethers (Cuadrado et al., 2004) etc, greatly stimulates their synthetic advancements. Although considerable effort has been made to the characterization of 1,1-bis(silyl)-2-arylalkenes, determination of their crystal structures remains almost unexplored. Here we report the crystal structure of 1,4-bis(2,2-bis(trimethylsilyl)ethenyl)benzene (1). To the best of our knowledge, this is the first example of structurally characterized 1,1-bis(silyl)-2-arylalkene without additional substituent in 2-position. The closest structure known contains t-butyl-Al instead of one SiMe3 group: 1,4-bis{2-di(tert-butyl)aluminium-2-trimethylsilyl-ethenyl}benzene (Uhl & Breher, 2000).

The overall conformation of the molecule 1 (Fig. 1) can be characterized by the dihedral angle between the benzene ring (planar within 0.0051 (7) Å) and approximately planar C11, C12, Si1, Si2 fragment (maximum deviation of 0.017 (1) Å); this angle is equal 51.75 (6)°.

The Si—C bonds differ in their lengths depending on the hybridization of the carbon atom; the mean values are 1.871 (4) Å for C(sp3) and 1.892 (2) Å for C(sp2). The silylethenyl substiuent changes the intraannular angles in benzene ring: the ipso angle is sharpened to 117.96 (11)°, while the neighbouring angle is widened to 121.19 (12)°.

Crystal packing (Fig. 2) is determined mainly by van der Waals interactions.

For related literature, see: Cuadrado et al. (2004); Hodgson et al. (1997); Inoue et al. (2001); Inoue et al. (2002); Pawluć et al. (2007); Uhl & Breher (2000).

Computing details top

Data collection: CrysAlis CCD (Oxford Diffraction, 2006); cell refinement: CrysAlis RED (Oxford Diffraction, 2006); data reduction: CrysAlis RED (Oxford Diffraction, 2006); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: XP (Siemens, 1989); software used to prepare material for publication: SHELXL97 (Sheldrick, 1997).

Figures top
[Figure 1] Fig. 1. A view of the molecule 1. The displacement ellipsoids are drawn at 50% probability level, the hydrogen atoms are depicted as small spheres of arbitrary radii. [Symmetry code: (') (3/2 - x,1/2 - y,-z)].
[Figure 2] Fig. 2. Crystal packing of 1 as seen along [010] direction.
1,4-Bis[2,2-bis(trimethylsilyl)ethenyl]benzene top
Crystal data top
C22H42Si4F(000) = 920
Mr = 418.92Dx = 1.034 Mg m3
Monoclinic, C2/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -C 2ycCell parameters from 6578 reflections
a = 31.050 (2) Åθ = 2–29°
b = 6.5882 (7) ŵ = 0.23 mm1
c = 13.1661 (14) ÅT = 100 K
β = 92.293 (7)°Needle, colourless
V = 2691.2 (4) Å30.5 × 0.05 × 0.05 mm
Z = 4
Data collection top
Kuma KM-4-CCD four-circle
diffractometer
3547 independent reflections
Radiation source: fine-focus sealed tube2579 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.033
Detector resolution: 8.1929 pixels mm-1θmax = 29.8°, θmin = 2.6°
ω scanh = 4143
Absorption correction: multi-scan
(CrysAlis RED; Oxford Diffraction, 2006)
k = 89
Tmin = 0.804, Tmax = 0.989l = 1716
13212 measured reflections
Refinement top
Refinement on F2Primary atom site location: structure-invariant direct methods
Least-squares matrix: fullSecondary atom site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.033Hydrogen site location: inferred from neighbouring sites
wR(F2) = 0.083H atoms treated by a mixture of independent and constrained refinement
S = 1.00 w = 1/[σ2(Fo2) + (0.05P)2]
where P = (Fo2 + 2Fc2)/3
3547 reflections(Δ/σ)max = 0.018
190 parametersΔρmax = 0.37 e Å3
0 restraintsΔρmin = 0.20 e Å3
Crystal data top
C22H42Si4V = 2691.2 (4) Å3
Mr = 418.92Z = 4
Monoclinic, C2/cMo Kα radiation
a = 31.050 (2) ŵ = 0.23 mm1
b = 6.5882 (7) ÅT = 100 K
c = 13.1661 (14) Å0.5 × 0.05 × 0.05 mm
β = 92.293 (7)°
Data collection top
Kuma KM-4-CCD four-circle
diffractometer
3547 independent reflections
Absorption correction: multi-scan
(CrysAlis RED; Oxford Diffraction, 2006)
2579 reflections with I > 2σ(I)
Tmin = 0.804, Tmax = 0.989Rint = 0.033
13212 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0330 restraints
wR(F2) = 0.083H atoms treated by a mixture of independent and constrained refinement
S = 1.00Δρmax = 0.37 e Å3
3547 reflectionsΔρmin = 0.20 e Å3
190 parameters
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
C10.79450 (4)0.2370 (2)0.01884 (9)0.0181 (3)
C20.77151 (4)0.0671 (2)0.01147 (9)0.0206 (3)
H20.7860 (4)0.065 (2)0.0170 (10)0.018 (3)*
C30.72761 (4)0.0789 (2)0.02898 (9)0.0210 (3)
H30.7131 (5)0.043 (2)0.0477 (12)0.028 (4)*
C110.84141 (4)0.2199 (2)0.03543 (9)0.0199 (3)
H110.8558 (4)0.144 (2)0.0183 (10)0.019 (3)*
C120.86443 (4)0.29150 (19)0.11281 (9)0.0175 (3)
Si10.924800 (11)0.25655 (6)0.09758 (3)0.02064 (10)
C1A0.95192 (5)0.5073 (3)0.11380 (15)0.0386 (4)
H1A10.9816 (6)0.485 (3)0.1030 (15)0.056 (3)*
H1A20.9454 (6)0.563 (3)0.1826 (16)0.056 (3)*
H1A30.9424 (6)0.602 (3)0.0683 (15)0.056 (3)*
C1B0.94583 (5)0.0721 (3)0.19101 (12)0.0312 (3)
H1B10.9482 (6)0.128 (3)0.2592 (16)0.054 (3)*
H1B20.9737 (6)0.034 (3)0.1695 (14)0.054 (3)*
H1B30.9279 (6)0.046 (3)0.1950 (15)0.054 (3)*
C1C0.94025 (5)0.1578 (3)0.03236 (12)0.0325 (4)
H1C10.9299 (5)0.023 (3)0.0403 (14)0.046 (3)*
H1C20.9694 (6)0.151 (3)0.0407 (13)0.046 (3)*
H1C30.9291 (6)0.245 (3)0.0857 (15)0.046 (3)*
Si20.839681 (11)0.40940 (6)0.23262 (3)0.01909 (10)
C2A0.83715 (5)0.6925 (2)0.22308 (13)0.0302 (3)
H2A10.8175 (7)0.738 (3)0.1752 (16)0.062 (4)*
H2A20.8630 (7)0.743 (3)0.2031 (16)0.062 (4)*
H2A30.8276 (7)0.750 (3)0.2808 (18)0.062 (4)*
C2B0.78577 (5)0.2995 (2)0.26891 (11)0.0245 (3)
H2B10.7631 (6)0.338 (3)0.2245 (13)0.046 (3)*
H2B20.7769 (5)0.341 (3)0.3307 (14)0.046 (3)*
H2B30.7883 (5)0.160 (3)0.2726 (13)0.046 (3)*
C2C0.87442 (5)0.3473 (3)0.34196 (11)0.0315 (3)
H2C10.9030 (6)0.400 (3)0.3346 (14)0.044 (3)*
H2C20.8765 (5)0.192 (3)0.3489 (13)0.044 (3)*
H2C30.8622 (5)0.404 (3)0.3989 (15)0.044 (3)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
C10.0164 (6)0.0255 (7)0.0124 (5)0.0011 (5)0.0006 (4)0.0016 (5)
C20.0223 (7)0.0216 (7)0.0179 (6)0.0049 (6)0.0025 (5)0.0013 (5)
C30.0212 (6)0.0228 (7)0.0193 (6)0.0007 (6)0.0042 (5)0.0001 (5)
C110.0176 (6)0.0239 (8)0.0182 (6)0.0035 (5)0.0009 (5)0.0007 (5)
C120.0152 (6)0.0175 (7)0.0199 (6)0.0010 (5)0.0004 (4)0.0029 (5)
Si10.01415 (17)0.0229 (2)0.02477 (19)0.00000 (14)0.00017 (13)0.00310 (15)
C1A0.0259 (8)0.0347 (10)0.0544 (11)0.0080 (7)0.0075 (7)0.0049 (8)
C1B0.0210 (7)0.0345 (9)0.0387 (8)0.0073 (7)0.0067 (6)0.0015 (7)
C1C0.0204 (7)0.0448 (10)0.0318 (8)0.0042 (7)0.0035 (6)0.0075 (7)
Si20.01679 (17)0.0216 (2)0.01887 (17)0.00176 (14)0.00090 (12)0.00212 (14)
C2A0.0252 (8)0.0256 (8)0.0395 (9)0.0005 (6)0.0020 (6)0.0056 (7)
C2B0.0233 (7)0.0291 (9)0.0208 (7)0.0009 (6)0.0032 (5)0.0015 (6)
C2C0.0291 (8)0.0434 (10)0.0222 (7)0.0088 (7)0.0049 (6)0.0078 (7)
Geometric parameters (Å, º) top
C1—C21.3944 (18)C1B—H1B20.934 (19)
C1—C3i1.3976 (18)C1B—H1B30.96 (2)
C1—C111.4855 (17)C1C—H1C10.954 (18)
C2—C31.3938 (17)C1C—H1C20.907 (18)
C2—H20.982 (14)C1C—H1C30.979 (19)
C3—C1i1.3976 (18)Si2—C2B1.8683 (14)
C3—H30.957 (15)Si2—C2A1.8709 (17)
C11—C121.3527 (18)Si2—C2C1.8781 (15)
C11—H110.962 (14)C2A—H2A10.94 (2)
C12—Si11.8914 (12)C2A—H2A20.90 (2)
C12—Si21.8933 (13)C2A—H2A30.89 (2)
Si1—C1B1.8656 (16)C2B—H2B10.966 (18)
Si1—C1A1.8702 (18)C2B—H2B20.891 (18)
Si1—C1C1.8748 (15)C2B—H2B30.922 (19)
C1A—H1A10.94 (2)C2C—H2C10.953 (18)
C1A—H1A20.99 (2)C2C—H2C21.030 (19)
C1A—H1A30.92 (2)C2C—H2C30.907 (19)
C1B—H1B10.97 (2)
C2—C1—C3i117.96 (11)H1B2—C1B—H1B3109.3 (17)
C2—C1—C11119.81 (12)Si1—C1C—H1C1110.5 (11)
C3i—C1—C11122.18 (12)Si1—C1C—H1C2110.1 (11)
C1—C2—C3121.19 (12)H1C1—C1C—H1C2106.3 (15)
C1—C2—H2119.7 (8)Si1—C1C—H1C3111.5 (10)
C3—C2—H2119.1 (8)H1C1—C1C—H1C3109.7 (15)
C2—C3—C1i120.83 (12)H1C2—C1C—H1C3108.6 (15)
C2—C3—H3118.1 (9)C2B—Si2—C2A111.32 (7)
C1i—C3—H3121.1 (9)C2B—Si2—C2C104.82 (7)
C12—C11—C1129.40 (12)C2A—Si2—C2C107.18 (8)
C12—C11—H11119.5 (8)C2B—Si2—C12112.57 (6)
C1—C11—H11111.1 (8)C2A—Si2—C12111.70 (7)
C11—C12—Si1115.40 (9)C2C—Si2—C12108.84 (6)
C11—C12—Si2124.17 (10)Si2—C2A—H2A1113.1 (11)
Si1—C12—Si2120.38 (6)Si2—C2A—H2A2110.3 (12)
C1B—Si1—C1A109.21 (8)H2A1—C2A—H2A2106.3 (17)
C1B—Si1—C1C106.97 (8)Si2—C2A—H2A3112.5 (12)
C1A—Si1—C1C108.11 (8)H2A1—C2A—H2A3103.5 (18)
C1B—Si1—C12112.39 (6)H2A2—C2A—H2A3110.8 (18)
C1A—Si1—C12109.22 (7)Si2—C2B—H2B1114.3 (10)
C1C—Si1—C12110.82 (6)Si2—C2B—H2B2110.9 (11)
Si1—C1A—H1A1106.8 (11)H2B1—C2B—H2B2105.4 (14)
Si1—C1A—H1A2110.7 (11)Si2—C2B—H2B3108.7 (11)
H1A1—C1A—H1A2111.1 (16)H2B1—C2B—H2B3111.0 (15)
Si1—C1A—H1A3111.5 (12)H2B2—C2B—H2B3106.3 (16)
H1A1—C1A—H1A3110.2 (16)Si2—C2C—H2C1113.8 (11)
H1A2—C1A—H1A3106.6 (16)Si2—C2C—H2C2108.9 (9)
Si1—C1B—H1B1113.9 (11)H2C1—C2C—H2C2108.0 (14)
Si1—C1B—H1B2108.6 (11)Si2—C2C—H2C3108.1 (11)
H1B1—C1B—H1B2106.0 (15)H2C1—C2C—H2C3107.0 (15)
Si1—C1B—H1B3110.3 (11)H2C2—C2C—H2C3111.2 (15)
H1B1—C1B—H1B3108.7 (16)
C3i—C1—C2—C31.42 (19)Si2—C12—Si1—C1A56.09 (10)
C11—C1—C2—C3179.12 (11)C11—C12—Si1—C1C7.46 (13)
C1—C2—C3—C1i1.5 (2)Si2—C12—Si1—C1C175.09 (8)
C2—C1—C11—C12134.75 (15)C11—C12—Si2—C2B31.27 (13)
C3i—C1—C11—C1247.6 (2)Si1—C12—Si2—C2B145.95 (8)
C1—C11—C12—Si1174.44 (11)C11—C12—Si2—C2A94.83 (12)
C1—C11—C12—Si28.2 (2)Si1—C12—Si2—C2A87.95 (9)
C11—C12—Si1—C1B112.18 (11)C11—C12—Si2—C2C147.03 (12)
Si2—C12—Si1—C1B65.27 (10)Si1—C12—Si2—C2C30.19 (10)
C11—C12—Si1—C1A126.46 (11)
Symmetry code: (i) x+3/2, y+1/2, z.

Experimental details

Crystal data
Chemical formulaC22H42Si4
Mr418.92
Crystal system, space groupMonoclinic, C2/c
Temperature (K)100
a, b, c (Å)31.050 (2), 6.5882 (7), 13.1661 (14)
β (°) 92.293 (7)
V3)2691.2 (4)
Z4
Radiation typeMo Kα
µ (mm1)0.23
Crystal size (mm)0.5 × 0.05 × 0.05
Data collection
DiffractometerKuma KM-4-CCD four-circle
Absorption correctionMulti-scan
(CrysAlis RED; Oxford Diffraction, 2006)
Tmin, Tmax0.804, 0.989
No. of measured, independent and
observed [I > 2σ(I)] reflections
13212, 3547, 2579
Rint0.033
(sin θ/λ)max1)0.698
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.033, 0.083, 1.00
No. of reflections3547
No. of parameters190
H-atom treatmentH atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å3)0.37, 0.20

Computer programs: CrysAlis CCD (Oxford Diffraction, 2006), CrysAlis RED (Oxford Diffraction, 2006), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), XP (Siemens, 1989).

 

Follow Acta Cryst. E
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds