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In the monomeric hafnium(IV) title compound, [Hf(C12H21N2Si)2Cl2], the Hf atom is N,N′-chelated by the N-silylated anilido ligand. The two ligands around the Hf atom are arranged cis to each other; a twofold rotation axis passes through the Hf atom. The two ends of the N—Si—N chelating unit exhibit different affinities to the metal center. The Zn—Namino bond is longer than the Zn—Nanilido bond. Along with two Cl atoms, the six–coordinate Hf atom demonstrates a highly distorted octa­hedral geometry.

Supporting information

cif

Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536807059569/rk2062sup1.cif
Contains datablocks I, global

hkl

Structure factor file (CIF format) https://doi.org/10.1107/S1600536807059569/rk2062Isup2.hkl
Contains datablock I

CCDC reference: 672723

Key indicators

  • Single-crystal X-ray study
  • T = 203 K
  • Mean [sigma](C-C)= 0.007 Å
  • R factor = 0.031
  • wR factor = 0.081
  • Data-to-parameter ratio = 16.4

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Comment top

Group 4 metal amides supported with the N–silylated anilido ligands were found to be highly active in catalyzing olefin polymerization reactions (Gibson et al., 1998; Hill & Hitchcock, 2002), which attracted us to the subject.

The N–silylated anilido ligand in the title compound has a pendant amino group. It results in an N—Si—N chelating moiety, which is presumed to be a "quasi" conjugated unit owing to dπ interaction between Si and N atoms. The zinc compounds coordinated with the analogous ligand have been reported by Schumann et al., (2000). The title compound is the first example of hafnium species. It is monomeric and contains two N–silylated anilido ligands, which are arranged in cis to each other and obey the C2 symmetrical operation. Such arrangement makes Hf atom right in the triangular plane of (N1···N2A···Cl1) and its symmetrical counterpart. Moreover, it presents the perpendicular relationship between the two planes and leads the molecule to display a highly distorted octahedral geometry. In the title compound, the Hf center is chelated, with an average N1—Hf—N2 angle of 68.04 (14)°. The corresponding N1—Si1—N2 angle 92.40 (18)° of the ligand is constrained nearly to be a right angle. The two values are quite different from those in the related amidinate and guanidinate hafnium(IV) compounds bearing the same geometry (Wood et al., 1999; Milanov et al., 2005), N—Hf—N being about 60° and N—C—N being larger than 110°. The Hf—Nanilido (Hf—N1) bond is 2.100 (4)Å whereas the Hf—-Namino (Hf—N2) bond is 2.397 (4)Å in the title compound. In the reported amidinate and guanidinate hafnium(IV) compounds, all Hf—N bonds are about 2.2 Å. Therefore by comparison, the N—C—N chelating unit is rigid and the N—Si—N group is much more flexible.

Related literature top

For the catalytic applications of related N-silylated analido group 4 metal compounds towards olefin polymerization, see: Gibson et al. (1998); Hill & Hitchcock (2002). For related amidinate or guanidinate hafnium(IV) compounds with the same geometry as the title compound, see: Wood et al. (1999); Milanov et al. (2005). For related zinc compounds supported with the analogous analido ligands, see: Schumann et al. (2000).

Experimental top

HfCl4 (0.81 g, 2.53 mmol) was added into the solution of [LiN(SiMe2NMe2)(2,6–Me2C6H3)]2 (1.15 g, 2.53 mmol) in Et2O (30 ml) at 273 K. The reaction mixture was warmed to room temperature and kept stirring for 12 h. It was dried in vacuum to remove all volatiles and the residue was extracted with CH2Cl2 (30 ml). Concentration of the filtrate under reduced pressure gave the title compound as colorless crystals (yield 1.15 g, 66%).

Refinement top

The methyl H atoms were then constrained to an ideal geometry, with C—H distances of 0.97Å and Uiso(H) = 1.5Ueq(C), but each group was allowed to rotate freely about its C—C bond. The other H atoms were placed in geometrically idealized positions and constrained to ride on their parent atoms, with C—H distances in the range 0.94Å and Uiso(H) = 1.2Ueq(C).

The highest residual peak of 1.74 e.Å-3 is 0.88Å from Hf1.

Computing details top

Data collection: SMART (Bruker, 2000); cell refinement: SAINT (Bruker, 2000); data reduction: SAINT (Bruker, 2000); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: SHELXTL/PC (Sheldrick, 1999); software used to prepare material for publication: SHELXL97 (Sheldrick, 1997).

Figures top
[Figure 1] Fig. 1. The molecular structure, showing the atom–numbering scheme. Displacement ellipsoids are drawn at the 30% probability level. H atoms are presented as spheres of arbitrary radius. Symmetry code: (i) -x + 1, y, -z + 3/2.
Dichloridobis{N-[(dimethylamino)dimethylsilyl]-2,6-dimethylanilido- κ2N,N'}hafnium(IV) top
Crystal data top
[Hf(C12H21N2Si)2Cl2]F(000) = 1392
Mr = 692.19Dx = 1.614 Mg m3
Monoclinic, C2/cMo Kα radiation, λ = 0.71073 Å
Hall symbol: -C 2ycCell parameters from 5767 reflections
a = 16.074 (6) Åθ = 2.4–27.5°
b = 10.209 (4) ŵ = 3.95 mm1
c = 18.736 (7) ÅT = 203 K
β = 112.117 (4)°Block, colourless
V = 2848.4 (18) Å30.10 × 0.10 × 0.05 mm
Z = 4
Data collection top
Bruker SMART area-detector
diffractometer
2510 independent reflections
Radiation source: fine–focus sealed tube2428 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.035
ϕ– and ω–scanθmax = 25.0°, θmin = 2.4°
Absorption correction: multi-scan
(SADABS; Sheldrick, 1996)
h = 1918
Tmin = 0.693, Tmax = 0.827k = 1211
6574 measured reflectionsl = 2214
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: inferred from neighbouring sites
R[F2 > 2σ(F2)] = 0.031H-atom parameters constrained
wR(F2) = 0.081 w = 1/[σ2(Fo2) + (0.0404P)2 + 9.7887P]
where P = (Fo2 + 2Fc2)/3
S = 1.03(Δ/σ)max = 0.001
2510 reflectionsΔρmax = 1.74 e Å3
153 parametersΔρmin = 1.44 e Å3
0 restraintsExtinction correction: SHELXL, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4
Primary atom site location: structure-invariant direct methodsExtinction coefficient: 0.00099 (12)
Crystal data top
[Hf(C12H21N2Si)2Cl2]V = 2848.4 (18) Å3
Mr = 692.19Z = 4
Monoclinic, C2/cMo Kα radiation
a = 16.074 (6) ŵ = 3.95 mm1
b = 10.209 (4) ÅT = 203 K
c = 18.736 (7) Å0.10 × 0.10 × 0.05 mm
β = 112.117 (4)°
Data collection top
Bruker SMART area-detector
diffractometer
2510 independent reflections
Absorption correction: multi-scan
(SADABS; Sheldrick, 1996)
2428 reflections with I > 2σ(I)
Tmin = 0.693, Tmax = 0.827Rint = 0.035
6574 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.0310 restraints
wR(F2) = 0.081H-atom parameters constrained
S = 1.03Δρmax = 1.74 e Å3
2510 reflectionsΔρmin = 1.44 e Å3
153 parameters
Special details top

Geometry. All s.u. (except the s.u. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell s.u. are taken into account individually in the estimation of s.u. in distances, angles and torsion angles; correlations between s.u. in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell s.u. is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R–factor wR and goodness of fit S are based on F2, conventional R–factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2σ(F2) is used only for calculating R–factors(gt) etc. and is not relevant to the choice of reflections for refinement. R–factors based on F2 are statistically about twice as large as those based on F, and R–factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Hf10.50000.73483 (2)0.75000.02959 (14)
Cl10.60246 (9)0.57611 (12)0.83593 (8)0.0482 (3)
Si10.53880 (8)0.80201 (14)0.60910 (8)0.0341 (3)
N10.4877 (2)0.8749 (3)0.6645 (2)0.0280 (8)
N20.5989 (3)0.6903 (4)0.6840 (2)0.0373 (9)
C10.4422 (3)0.9973 (4)0.6421 (2)0.0277 (9)
C20.4898 (3)1.1150 (4)0.6592 (2)0.0309 (9)
C30.4435 (4)1.2323 (4)0.6394 (3)0.0367 (11)
H3A0.47571.31140.65200.044*
C40.3524 (4)1.2361 (4)0.6022 (3)0.0400 (12)
H4A0.32201.31670.59010.048*
C50.3060 (3)1.1205 (5)0.5826 (3)0.0361 (10)
H5A0.24351.12280.55570.043*
C60.3487 (3)1.0006 (5)0.6012 (2)0.0322 (10)
C70.5897 (3)1.1225 (5)0.6996 (3)0.0352 (10)
H7A0.61741.12790.66180.053*
H7B0.61121.04470.73100.053*
H7C0.60531.19960.73230.053*
C80.2938 (3)0.8783 (5)0.5747 (3)0.0476 (13)
H8A0.25400.86830.60250.071*
H8B0.33340.80310.58450.071*
H8C0.25840.88450.51990.071*
C90.6134 (3)0.9025 (5)0.5765 (3)0.0442 (12)
H9A0.59820.88900.52180.066*
H9B0.67530.87700.60460.066*
H9C0.60580.99430.58610.066*
C100.4649 (4)0.7144 (6)0.5218 (3)0.0509 (14)
H10A0.48020.73950.47830.076*
H10B0.40280.73700.51130.076*
H10C0.47300.62070.53000.076*
C110.6884 (4)0.7404 (5)0.7317 (4)0.0527 (15)
H11A0.72980.72340.70630.079*
H11B0.70950.69700.78140.079*
H11C0.68490.83400.73900.079*
C120.6097 (4)0.5532 (5)0.6616 (4)0.0588 (16)
H12A0.65180.55170.63570.088*
H12B0.55200.51990.62720.088*
H12C0.63240.49890.70740.088*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Hf10.02721 (18)0.02347 (18)0.0387 (2)0.0000.01318 (12)0.000
Cl10.0491 (7)0.0331 (6)0.0634 (8)0.0120 (5)0.0225 (6)0.0153 (6)
Si10.0308 (6)0.0344 (7)0.0372 (7)0.0026 (5)0.0129 (5)0.0024 (5)
N10.0227 (17)0.0279 (19)0.0297 (18)0.0008 (13)0.0056 (14)0.0014 (15)
N20.033 (2)0.033 (2)0.048 (2)0.0074 (17)0.0184 (18)0.0058 (18)
C10.026 (2)0.031 (2)0.024 (2)0.0005 (17)0.0069 (17)0.0024 (17)
C20.029 (2)0.035 (2)0.027 (2)0.0016 (17)0.0092 (18)0.0008 (18)
C30.044 (3)0.027 (2)0.038 (3)0.0012 (18)0.014 (2)0.0016 (18)
C40.042 (3)0.037 (3)0.039 (3)0.009 (2)0.012 (2)0.004 (2)
C50.027 (2)0.046 (3)0.030 (2)0.0072 (19)0.0058 (18)0.001 (2)
C60.028 (2)0.036 (2)0.031 (2)0.0004 (18)0.0089 (18)0.0032 (18)
C70.031 (2)0.036 (3)0.036 (2)0.0066 (18)0.0085 (19)0.004 (2)
C80.029 (2)0.044 (3)0.056 (3)0.005 (2)0.000 (2)0.011 (2)
C90.046 (3)0.045 (3)0.045 (3)0.003 (2)0.022 (2)0.002 (2)
C100.056 (3)0.052 (3)0.041 (3)0.007 (3)0.014 (3)0.014 (3)
C110.030 (3)0.064 (4)0.059 (4)0.011 (2)0.011 (3)0.015 (3)
C120.070 (4)0.036 (3)0.084 (4)0.019 (3)0.045 (3)0.006 (3)
Geometric parameters (Å, º) top
Hf1—N1i2.100 (4)C5—C61.382 (6)
Hf1—N12.100 (4)C5—H5A0.9400
Hf1—N22.397 (4)C6—C81.501 (6)
Hf1—N2i2.397 (4)C7—H7A0.9700
Hf1—Cl1i2.4359 (13)C7—H7B0.9700
Hf1—Cl12.4359 (13)C7—H7C0.9700
Hf1—Si1i3.0114 (16)C8—H8A0.9700
Si1—N11.717 (4)C8—H8B0.9700
Si1—N21.784 (4)C8—H8C0.9700
Si1—C91.848 (5)C9—H9A0.9700
Si1—C101.851 (5)C9—H9B0.9700
N1—C11.429 (5)C9—H9C0.9700
N2—C111.470 (7)C10—H10A0.9700
N2—C121.489 (7)C10—H10B0.9700
C1—C21.395 (6)C10—H10C0.9700
C1—C61.407 (6)C11—H11A0.9700
C2—C31.384 (6)C11—H11B0.9700
C2—C71.498 (6)C11—H11C0.9700
C3—C41.365 (8)C12—H12A0.9700
C3—H3A0.9400C12—H12B0.9700
C4—C51.371 (7)C12—H12C0.9700
C4—H4A0.9400
N1i—Hf1—N194.2 (2)C3—C4—C5118.9 (4)
N1i—Hf1—N2129.21 (14)C3—C4—H4A120.6
N1—Hf1—N268.04 (14)C5—C4—H4A120.6
N1i—Hf1—N2i68.04 (14)C4—C5—C6121.8 (4)
N1—Hf1—N2i129.21 (14)C4—C5—H5A119.1
N2—Hf1—N2i158.1 (2)C6—C5—H5A119.1
N1i—Hf1—Cl1i143.43 (10)C5—C6—C1119.0 (4)
N1—Hf1—Cl1i95.91 (10)C5—C6—C8118.6 (4)
N2—Hf1—Cl1i87.01 (11)C1—C6—C8122.4 (4)
N2i—Hf1—Cl1i78.46 (10)C2—C7—H7A109.5
N1i—Hf1—Cl195.91 (10)C2—C7—H7B109.5
N1—Hf1—Cl1143.43 (10)H7A—C7—H7B109.5
N2—Hf1—Cl178.46 (10)C2—C7—H7C109.5
N2i—Hf1—Cl187.01 (11)H7A—C7—H7C109.5
Cl1i—Hf1—Cl196.60 (7)H7B—C7—H7C109.5
N1i—Hf1—Si1i33.65 (10)C6—C8—H8A109.5
N1—Hf1—Si1i121.48 (10)C6—C8—H8B109.5
N2—Hf1—Si1i153.13 (10)H8A—C8—H8B109.5
N2i—Hf1—Si1i36.33 (10)C6—C8—H8C109.5
Cl1i—Hf1—Si1i114.79 (4)H8A—C8—H8C109.5
Cl1—Hf1—Si1i83.32 (5)H8B—C8—H8C109.5
N1—Si1—N292.40 (18)Si1—C9—H9A109.5
N1—Si1—C9118.5 (2)Si1—C9—H9B109.5
N2—Si1—C9112.8 (2)H9A—C9—H9B109.5
N1—Si1—C10116.7 (2)Si1—C9—H9C109.5
N2—Si1—C10111.3 (3)H9A—C9—H9C109.5
C9—Si1—C10104.9 (3)H9B—C9—H9C109.5
C1—N1—Si1120.6 (3)Si1—C10—H10A109.5
C1—N1—Hf1135.3 (3)Si1—C10—H10B109.5
Si1—N1—Hf1103.71 (17)H10A—C10—H10B109.5
C11—N2—C12107.9 (4)Si1—C10—H10C109.5
C11—N2—Si1111.8 (3)H10A—C10—H10C109.5
C12—N2—Si1117.7 (4)H10B—C10—H10C109.5
C11—N2—Hf1107.9 (4)N2—C11—H11A109.5
C12—N2—Hf1119.6 (3)N2—C11—H11B109.5
Si1—N2—Hf190.94 (16)H11A—C11—H11B109.5
C2—C1—C6119.1 (4)N2—C11—H11C109.5
C2—C1—N1120.6 (4)H11A—C11—H11C109.5
C6—C1—N1120.3 (4)H11B—C11—H11C109.5
C3—C2—C1119.4 (4)N2—C12—H12A109.5
C3—C2—C7117.2 (4)N2—C12—H12B109.5
C1—C2—C7123.4 (4)H12A—C12—H12B109.5
C4—C3—C2121.8 (4)N2—C12—H12C109.5
C4—C3—H3A119.1H12A—C12—H12C109.5
C2—C3—H3A119.1H12B—C12—H12C109.5
Symmetry code: (i) x+1, y, z+3/2.

Experimental details

Crystal data
Chemical formula[Hf(C12H21N2Si)2Cl2]
Mr692.19
Crystal system, space groupMonoclinic, C2/c
Temperature (K)203
a, b, c (Å)16.074 (6), 10.209 (4), 18.736 (7)
β (°) 112.117 (4)
V3)2848.4 (18)
Z4
Radiation typeMo Kα
µ (mm1)3.95
Crystal size (mm)0.10 × 0.10 × 0.05
Data collection
DiffractometerBruker SMART area-detector
diffractometer
Absorption correctionMulti-scan
(SADABS; Sheldrick, 1996)
Tmin, Tmax0.693, 0.827
No. of measured, independent and
observed [I > 2σ(I)] reflections
6574, 2510, 2428
Rint0.035
(sin θ/λ)max1)0.595
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.031, 0.081, 1.03
No. of reflections2510
No. of parameters153
H-atom treatmentH-atom parameters constrained
Δρmax, Δρmin (e Å3)1.74, 1.44

Computer programs: SMART (Bruker, 2000), SAINT (Bruker, 2000), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), SHELXTL/PC (Sheldrick, 1999).

 

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