supplementary materials


om2221 scheme

Acta Cryst. (2008). E64, o771    [ doi:10.1107/S1600536808008167 ]

4-Bromophenyl benzoate

B. T. Gowda, S. Foro, K. S. Babitha and H. Fuess

Abstract top

The structure of the title compound (4BPBA), C13H9BrO2, is similar to that of phenyl benzoate (PBA), 4-methylphenyl benzoate (4MePBA) and 4-methoxyphenyl benzoate, with somewhat different bond parameters. The dihedral angle between the phenyl and benzoyl rings in 4BPBA is 58.43 (17)°, compared with values of 55.7° in PBA and 60.17 (7)° in 4MPBA. The molecules in the title compound are packed into infinite chains in the a-axis direction.

Comment top

In the present work, the structure of 4-bromophenyl benzoate (4BPBA) has been determined, as part of a study of substituent effects on the structures of industrially significant compounds (Gowda, Foro, Babitha & Fuess, 2007; Gowda, Foro, Nayak & Fuess, 2007). The structure of 4BPBA (Fig. 1) resembles those of phenyl benzoate (PBA) (Adams & Morsi, 1976), 4-methylphenyl benzoate (4MePBA), 4-methoxyphenyl benzoate (4MeOPBA), 3-methylphenyl benzoate (3MePBA), 2,3-dichlorophenyl benzoate (23DCPBA) and other aryl benzoates (Gowda, Foro, Babitha & Fuess, 2007; Gowda, Foro, Nayak & Fuess, 2007). The bond parameters in 4BPBA are similar to those in PBA, 4MePBA, 4MeOPBA, 3MePBA, 23DCPBA and other benzoates (Adams & Morsi, 1976; Gowda, Foro, Babitha & Fuess, 2007; Gowda, Foro, Nayak & Fuess, 2007). The molecules in the title compound are packed into chains in the bc plane (Fig. 2).

Related literature top

For related literature, see: Adams & Morsi (1976); Gowda, Foro, Babitha & Fuess (2007); Gowda, Foro, Nayak & Fuess (2007); Nayak & Gowda (2008).

Experimental top

The title compound was prepared according to a literature method (Nayak & Gowda, 2008). The purity of the compound was checked by determining its melting point. It was characterized by recording its infrared and NMR spectra (Nayak & Gowda, 2008). Single crystals of the title compound were obtained by slow evaporation of an ethanolic solution and used for X-ray diffraction studies at room temperature.

Refinement top

The H atoms were positioned with idealized geometry using a riding model (C—H = 0.93 Å) with Uiso = 1.2 Ueq of the parent atom.

The residual electron-density features are located in the region of Br1. The highest peak is 0.91 Å from C4 and deepest hole is 0.78 Å from Br1.

Computing details top

Data collection: CAD-4-PC Software (Enraf–Nonius, 1996); cell refinement: CAD-4-PC Software (Enraf–Nonius, 1996); data reduction: REDU4 (Stoe & Cie, 1987); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: PLATON (Spek, 2003); software used to prepare material for publication: SHELXL97 (Sheldrick, 2008).

Figures top
[Figure 1] Fig. 1. Molecular structure of the title compound, showing the atom labeling. Displacement ellipsoids are drawn at the 50% probability level.
[Figure 2] Fig. 2. Molecular packing of the title compound as viewed down the bc plane.
4-Bromophenyl benzoate top
Crystal data top
C13H9BrO2F000 = 552
Mr = 277.11Dx = 1.584 Mg m3
Orthorhombic, Pca21Cu Kα radiation
λ = 1.54180 Å
Hall symbol: P 2c -2acCell parameters from 25 reflections
a = 7.748 (1) Åθ = 9.9–23.4º
b = 5.5946 (7) ŵ = 4.67 mm1
c = 26.814 (5) ÅT = 299 (2) K
V = 1162.3 (3) Å3Plate, colourless
Z = 40.38 × 0.30 × 0.08 mm
Data collection top
Enraf–Nonius CAD-4
diffractometer
Rint = 0.039
Radiation source: fine-focus sealed tubeθmax = 66.9º
Monochromator: graphiteθmin = 3.3º
T = 299(2) Kh = 1→9
ω/2θ scansk = 1→6
Absorption correction: ψ scan
(North et al., 1968)
l = 8→32
Tmin = 0.242, Tmax = 0.6853 standard reflections
1986 measured reflections every 120 min
1442 independent reflections intensity decay: 2.0%
1252 reflections with I > 2σ(I)
Refinement top
Refinement on F2Hydrogen site location: inferred from neighbouring sites
Least-squares matrix: fullH-atom parameters constrained
R[F2 > 2σ(F2)] = 0.059  w = 1/[σ2(Fo2) + (0.1268P)2 + 0.565P]
where P = (Fo2 + 2Fc2)/3
wR(F2) = 0.189(Δ/σ)max = 0.001
S = 1.15Δρmax = 1.04 e Å3
1442 reflectionsΔρmin = 1.32 e Å3
145 parametersExtinction correction: none
1 restraintAbsolute structure: Flack (1983), with 375 Friedel pairs
Primary atom site location: structure-invariant direct methodsFlack parameter: 0.04 (6)
Secondary atom site location: difference Fourier map
Crystal data top
C13H9BrO2V = 1162.3 (3) Å3
Mr = 277.11Z = 4
Orthorhombic, Pca21Cu Kα
a = 7.748 (1) ŵ = 4.67 mm1
b = 5.5946 (7) ÅT = 299 (2) K
c = 26.814 (5) Å0.38 × 0.30 × 0.08 mm
Data collection top
Enraf–Nonius CAD-4
diffractometer
1252 reflections with I > 2σ(I)
Absorption correction: ψ scan
(North et al., 1968)
Rint = 0.039
Tmin = 0.242, Tmax = 0.6853 standard reflections
1986 measured reflections every 120 min
1442 independent reflections intensity decay: 2.0%
Refinement top
R[F2 > 2σ(F2)] = 0.059H-atom parameters constrained
wR(F2) = 0.189Δρmax = 1.04 e Å3
S = 1.15Δρmin = 1.32 e Å3
1442 reflectionsAbsolute structure: Flack (1983), with 375 Friedel pairs
145 parametersFlack parameter: 0.04 (6)
1 restraint
Special details top

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
Br10.29159 (16)0.2659 (2)0.12742 (8)0.0950 (5)
O10.4692 (6)0.1882 (9)0.0901 (2)0.0581 (13)
O20.3231 (11)0.5195 (14)0.1104 (3)0.107 (3)
C10.4260 (8)0.2190 (10)0.0403 (3)0.0463 (14)
C20.4854 (8)0.4121 (12)0.0127 (3)0.0544 (16)
H20.55000.53210.02780.065*
C30.4478 (8)0.4229 (12)0.0367 (3)0.0560 (17)
H30.48880.54920.05590.067*
C40.3474 (11)0.2440 (12)0.0586 (3)0.0559 (17)
C50.2920 (9)0.0437 (12)0.0313 (3)0.0589 (18)
H50.23010.07940.04620.071*
C60.3332 (9)0.0389 (13)0.0176 (3)0.0583 (17)
H60.29770.09080.03680.070*
C70.4106 (9)0.3510 (14)0.1226 (3)0.0577 (17)
C80.4601 (9)0.2976 (12)0.1748 (3)0.0521 (15)
C90.5527 (8)0.0900 (13)0.1879 (3)0.0585 (17)
H90.58460.02090.16380.070*
C100.5943 (10)0.0558 (13)0.2368 (4)0.0644 (19)
H100.65440.08200.24540.077*
C110.5530 (10)0.2107 (14)0.2731 (4)0.0627 (19)
H110.58340.18030.30600.075*
C120.4636 (9)0.4180 (14)0.2604 (3)0.0602 (17)
H120.43530.52840.28510.072*
C130.4164 (9)0.4607 (13)0.2112 (3)0.0585 (16)
H130.35580.59850.20290.070*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
Br10.1056 (8)0.1322 (9)0.0472 (6)0.0167 (6)0.0058 (7)0.0056 (7)
O10.053 (2)0.064 (3)0.058 (3)0.008 (2)0.003 (2)0.011 (3)
O20.145 (6)0.117 (5)0.059 (4)0.089 (5)0.005 (4)0.001 (4)
C10.044 (3)0.047 (3)0.049 (4)0.003 (2)0.001 (3)0.003 (3)
C20.046 (3)0.052 (3)0.066 (5)0.007 (3)0.004 (3)0.009 (3)
C30.055 (3)0.052 (3)0.061 (5)0.007 (3)0.011 (3)0.005 (3)
C40.058 (4)0.067 (4)0.042 (4)0.006 (3)0.005 (4)0.006 (3)
C50.062 (4)0.049 (3)0.066 (5)0.004 (3)0.005 (4)0.006 (3)
C60.054 (3)0.058 (4)0.063 (5)0.012 (3)0.002 (4)0.010 (4)
C70.050 (3)0.068 (4)0.055 (4)0.019 (3)0.004 (3)0.002 (4)
C80.051 (3)0.055 (3)0.050 (4)0.005 (3)0.006 (3)0.001 (3)
C90.053 (3)0.062 (3)0.061 (4)0.017 (3)0.004 (3)0.010 (4)
C100.057 (3)0.062 (4)0.074 (5)0.007 (3)0.008 (4)0.015 (4)
C110.056 (3)0.082 (5)0.050 (5)0.001 (3)0.002 (3)0.003 (4)
C120.064 (4)0.065 (4)0.052 (4)0.007 (3)0.005 (4)0.002 (4)
C130.056 (3)0.059 (4)0.060 (4)0.010 (3)0.003 (3)0.001 (3)
Geometric parameters (Å, °) top
Br1—C41.899 (9)C6—H60.9300
O1—C71.340 (10)C7—C81.481 (12)
O1—C11.388 (10)C8—C131.379 (11)
O2—C71.206 (9)C8—C91.410 (10)
C1—C61.379 (10)C9—C101.364 (12)
C1—C21.388 (10)C9—H90.9300
C2—C31.356 (12)C10—C111.342 (12)
C2—H20.9300C10—H100.9300
C3—C41.398 (11)C11—C121.392 (11)
C3—H30.9300C11—H110.9300
C4—C51.406 (11)C12—C131.390 (12)
C5—C61.351 (12)C12—H120.9300
C5—H50.9300C13—H130.9300
C7—O1—C1117.4 (5)O2—C7—C8124.1 (7)
C6—C1—C2120.4 (8)O1—C7—C8112.9 (6)
C6—C1—O1117.3 (6)C13—C8—C9119.5 (8)
C2—C1—O1122.0 (6)C13—C8—C7118.2 (6)
C3—C2—C1118.9 (6)C9—C8—C7122.2 (7)
C3—C2—H2120.5C10—C9—C8118.4 (7)
C1—C2—H2120.5C10—C9—H9120.8
C2—C3—C4119.9 (7)C8—C9—H9120.8
C2—C3—H3120.1C11—C10—C9123.4 (7)
C4—C3—H3120.1C11—C10—H10118.3
C3—C4—C5121.4 (8)C9—C10—H10118.3
C3—C4—Br1119.3 (6)C10—C11—C12118.7 (8)
C5—C4—Br1119.2 (6)C10—C11—H11120.7
C6—C5—C4116.7 (7)C12—C11—H11120.7
C6—C5—H5121.6C13—C12—C11120.4 (8)
C4—C5—H5121.6C13—C12—H12119.8
C5—C6—C1122.4 (7)C11—C12—H12119.8
C5—C6—H6118.8C8—C13—C12119.6 (7)
C1—C6—H6118.8C8—C13—H13120.2
O2—C7—O1123.0 (8)C12—C13—H13120.2
C7—O1—C1—C6120.1 (7)C1—O1—C7—C8178.5 (6)
C7—O1—C1—C265.4 (9)O2—C7—C8—C135.8 (12)
C6—C1—C2—C31.3 (10)O1—C7—C8—C13175.9 (6)
O1—C1—C2—C3175.6 (6)O2—C7—C8—C9175.6 (9)
C1—C2—C3—C41.4 (10)O1—C7—C8—C92.7 (10)
C2—C3—C4—C53.8 (10)C13—C8—C9—C100.9 (10)
C2—C3—C4—Br1178.5 (5)C7—C8—C9—C10179.5 (7)
C3—C4—C5—C63.2 (10)C8—C9—C10—C110.6 (12)
Br1—C4—C5—C6179.1 (6)C9—C10—C11—C120.3 (12)
C4—C5—C6—C10.5 (11)C10—C11—C12—C130.9 (11)
C2—C1—C6—C51.8 (11)C9—C8—C13—C120.3 (11)
O1—C1—C6—C5176.4 (7)C7—C8—C13—C12178.9 (7)
C1—O1—C7—O20.2 (12)C11—C12—C13—C80.6 (11)
Acknowledgements top

BTG thanks the Alexander von Humboldt Foundation, Bonn, Germany, for extensions to his research fellowship.

references
References top

Adams, J. M. & Morsi, S. E. (1976). Acta Cryst. B32, 1345–1347.

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Gowda, B. T., Foro, S., Babitha, K. S. & Fuess, H. (2007). Acta Cryst. E63, o4286.

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Nayak, R. & Gowda, B. T. (2008). Z. Naturforsch. Teil A, 63. In the press.

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Spek, A. L. (2003). J. Appl. Cryst. 36, 7–13.

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