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Volume 64 
Part 5 
Page o870  
May 2008  

Received 30 March 2008
Accepted 15 April 2008
Online 18 April 2008

Key indicators
Single-crystal X-ray study
T = 273 K
Mean [sigma](C-C) = 0.005 Å
R = 0.053
wR = 0.160
Data-to-parameter ratio = 16.2
Details
Open access

Trichlorido(N,N'-di-tert-butylbenzamidinato-[kappa]2N,N')silicon

aSchool of Chemical and Materials Engineering, Jiangnan University, 1800 Lihu Road, Wuxi, Jiangsu Province 214122, People's Republic of China, and bCollege of Pharmacy, GuangDong Pharmaceutical University, Guangzhou, Guangdong Province 510006, People's Republic of China
Correspondence e-mail: chunxiaren@sina.com, liweijun947@163.com

In the title molecule, C15H23Cl3N2Si, the Si atom is pentacoordinated by two N atoms [Si-N = 1.780 (3) and 1.931 (3) Å] from the benzamidinate ligand and three chloride anions [Si-Cl = 2.0711 (14)-2.1449 (14) Å] in a distorted trigonal-bipyramidal geometry.

Related literature

For the geometric parameters of related silicon complexes, see: So et al. (2006[So, C.-W., Roesky, H. W., Magull, J. & Oswald, R. B. (2006). Angew. Chem. Int. Ed. 45, 3948-3950.]); Hargittai et al. (1983[Hargittai, I., Schultz, G., Tremmel, J., Kagramanov, N. D., Maltsev, A. K. & Nefedov, O. M. (1983). J. Am. Chem. Soc. 105, 2895-2896.]); Koe et al. (1998[Koe, J. R., Powell, D. R., Buffy, J. J., Hayase, S. & West, R. (1998). Angew. Chem. Int. Ed. 37, 1441-1442.]); Karsch et al. (1998[Karsch, H. H., Schlüter, P. A. & Reisky, M. (1998). Eur. J. Inorg. Chem. pp. 433-436.]); Jones et al. (2002[Jones, C., Junk, P. C., Leary, S. G., Smithies, N. A. & Steed, J. W. (2002). Inorg. Chem. Commun. 5, 533-536.]).

[Scheme 1]

Experimental

Crystal data
  • C15H23Cl3N2Si

  • Mr = 365.80

  • Triclinic, [P \overline 1]

  • a = 6.372 (3) Å

  • b = 10.278 (4) Å

  • c = 14.229 (6) Å

  • [alpha] = 83.222 (6)°

  • [beta] = 83.227 (6)°

  • [gamma] = 84.189 (6)°

  • V = 915.3 (7) Å3

  • Z = 2

  • Mo K[alpha] radiation

  • [mu] = 0.56 mm-1

  • T = 273 (2) K

  • 0.35 × 0.26 × 0.15 mm

Data collection
  • Bruker SMART CCD area-detector diffractometer

  • Absorption correction: none

  • 4535 measured reflections

  • 3166 independent reflections

  • 2189 reflections with I > 2[sigma](I)

  • Rint = 0.028

Refinement
  • R[F2 > 2[sigma](F2)] = 0.053

  • wR(F2) = 0.159

  • S = 0.99

  • 3166 reflections

  • 196 parameters

  • H-atom parameters constrained

  • [Delta][rho]max = 0.44 e Å-3

  • [Delta][rho]min = -0.43 e Å-3

Data collection: SMART (Bruker, 1998[Bruker, (1998). SMART and SAINT-Plus. Bruker AXS Inc., Madison, Wisconsin, USA.]); cell refinement: SAINT-Plus (Bruker, 1998[Bruker, (1998). SMART and SAINT-Plus. Bruker AXS Inc., Madison, Wisconsin, USA.]); data reduction: SAINT-Plus; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: PLATON (Spek, 2003[Spek, A. L. (2003). J. Appl. Cryst. 36, 7-13.]); software used to prepare material for publication: SHELXL97.


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: CV2396 ).


Acknowledgements

This work was supported by the National Natural Science Foundation of China (grant Nos. 20571033 and 20701016).

References

Bruker, (1998). SMART and SAINT-Plus. Bruker AXS Inc., Madison, Wisconsin, USA.
Hargittai, I., Schultz, G., Tremmel, J., Kagramanov, N. D., Maltsev, A. K. & Nefedov, O. M. (1983). J. Am. Chem. Soc. 105, 2895-2896.  [CrossRef] [ChemPort] [ISI]
Jones, C., Junk, P. C., Leary, S. G., Smithies, N. A. & Steed, J. W. (2002). Inorg. Chem. Commun. 5, 533-536.  [ISI] [CrossRef] [ChemPort]
Karsch, H. H., Schlüter, P. A. & Reisky, M. (1998). Eur. J. Inorg. Chem. pp. 433-436.  [CrossRef]
Koe, J. R., Powell, D. R., Buffy, J. J., Hayase, S. & West, R. (1998). Angew. Chem. Int. Ed. 37, 1441-1442.  [CrossRef] [ChemPort]
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]
So, C.-W., Roesky, H. W., Magull, J. & Oswald, R. B. (2006). Angew. Chem. Int. Ed. 45, 3948-3950.  [ISI] [CrossRef] [ChemPort]
Spek, A. L. (2003). J. Appl. Cryst. 36, 7-13.  [CrossRef] [details]


Acta Cryst (2008). E64, o870  [ doi:10.1107/S1600536808010398 ]

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