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Volume 64 
Part 9 
Page o1724  
September 2008  

Received 31 July 2008
Accepted 1 August 2008
Online 9 August 2008

Key indicators
Single-crystal X-ray study
T = 130 K
Mean [sigma](C-C) = 0.002 Å
Disorder in solvent or counterion
R = 0.030
wR = 0.078
Data-to-parameter ratio = 15.3
Details
Open access

Bis(4,6-diaminopyrimidin-2-yl) disulfide dimethyl sufoxide disolvate

aDepartment of Chemistry, Aristotle University of Thessaloniki, 54006 Thessaloniki, Greece,bAl Huson University College, Al Balqa' Applied University, Al-Huson, Jordan, and cFaculty of Chemistry, Adam Mickiewicz University, 60-780 Poznan, Poland
Correspondence e-mail: magdan@amu.edu.pl

The title compound, C8H10N8S2·2C2H6SO, was obtained unintentionally during an attempt to prepare a thiolate derivative of trimethyltin. The complete disulfide molecule is generated by twofold rotation symmetry and the C-S-S-C torsion angle around the S-S bond is -85.70 (10)°. The molecules are connected via N-H...N hydrogen bonds into strongly corrugated layers parallel to (001), generating an R22(8) motif. The solvent molecule, which exhibits minor disorder of its S atom [site occupancies = 0.9591 (18) and 0.0409 (18)], is linked to this layer via a pair of N-H...O interactions.

Related literature

For information on the preferred conformations of organic disulfides, see: Saczewski et al. (2006[Saczewski, J., Frontera, A., Gdaniec, M., Brzozowski, Z., Saczewski, F., Tabin, P., Quinoñero, D. & Deyà, P. M. (2006). Chem. Phys. Lett. 422, 234-239.]).

[Scheme 1]

Experimental

Crystal data
  • C8H10N8S2·2C2H6OS

  • Mr = 438.62

  • Orthorhombic, P c c n

  • a = 11.2612 (4) Å

  • b = 11.9948 (5) Å

  • c = 15.0754 (6) Å

  • V = 2036.32 (14) Å3

  • Z = 4

  • Mo K[alpha] radiation

  • [mu] = 0.49 mm-1

  • T = 130 (2) K

  • 0.40 × 0.10 × 0.10 mm

Data collection
  • Kuma KM-4-CCD [kappa] geometry diffractometer

  • Absorption correction: none

  • 17524 measured reflections

  • 2240 independent reflections

  • 1944 reflections with I > 2[sigma](I)

  • Rint = 0.035

Refinement
  • R[F2 > 2[sigma](F2)] = 0.029

  • wR(F2) = 0.078

  • S = 1.04

  • 2240 reflections

  • 146 parameters

  • H atoms treated by a mixture of independent and constrained refinement

  • [Delta][rho]max = 0.23 e Å-3

  • [Delta][rho]min = -0.31 e Å-3

Table 1
Hydrogen-bond geometry (Å, °)

D-H...A D-H H...A D...A D-H...A
N7-H7A...O1i 0.78 (2) 2.20 (2) 2.959 (2) 165 (2)
N7-H7B...N1ii 0.846 (19) 2.33 (2) 3.169 (2) 175.1 (16)
N8-H8A...O1iii 0.84 (2) 2.09 (2) 2.9109 (19) 164.4 (18)
N8-H8B...N3iv 0.81 (2) 2.33 (2) 3.088 (2) 156.8 (19)
Symmetry codes: (i) [-x+{\script{1\over 2}}, y, z-{\script{1\over 2}}]; (ii) [-x+1, y-{\script{1\over 2}}, -z+{\script{1\over 2}}]; (iii) [x, -y+{\script{1\over 2}}, z-{\script{1\over 2}}]; (iv) [-x+1, y+{\script{1\over 2}}, -z+{\script{1\over 2}}].

Data collection: CrysAlis CCD (Oxford Diffraction, 2003[Oxford Diffraction (2003). CrysAlis CCD and CrysAlis RED. Oxford Diffraction, Abingdon, Oxfordshire, England.]); cell refinement: CrysAlis CCD; data reduction: CrysAlis RED (Oxford Diffraction, 2003[Oxford Diffraction (2003). CrysAlis CCD and CrysAlis RED. Oxford Diffraction, Abingdon, Oxfordshire, England.]); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: Stereochemical Workstation Operation Manual (Siemens, 1989[Siemens (1989). Stereochemical Workstation Operation Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]) and Mercury (Macrae et al., 2006[Macrae, C. F., Edgington, P. R., McCabe, P., Pidcock, E., Shields, G. P., Taylor, R., Towler, M. & van de Streek, J. (2006). J. Appl. Cryst. 39, 453-457.]); software used to prepare material for publication: SHELXL97.


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: HB2773 ).


References

Macrae, C. F., Edgington, P. R., McCabe, P., Pidcock, E., Shields, G. P., Taylor, R., Towler, M. & van de Streek, J. (2006). J. Appl. Cryst. 39, 453-457.  [ISI] [CrossRef] [ChemPort] [details]
Oxford Diffraction (2003). CrysAlis CCD and CrysAlis RED. Oxford Diffraction, Abingdon, Oxfordshire, England.
Saczewski, J., Frontera, A., Gdaniec, M., Brzozowski, Z., Saczewski, F., Tabin, P., Quinoñero, D. & Deyà, P. M. (2006). Chem. Phys. Lett. 422, 234-239.
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]
Siemens (1989). Stereochemical Workstation Operation Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.


Acta Cryst (2008). E64, o1724  [ doi:10.1107/S160053680802480X ]

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