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Volume 64 
Part 11 
Page m1412  
November 2008  

Received 15 September 2008
Accepted 12 October 2008
Online 15 October 2008

Key indicators
Single-crystal X-ray study
T = 295 K
Mean [sigma](C-C) = 0.009 Å
R = 0.057
wR = 0.132
Data-to-parameter ratio = 16.7
Details
Open access

Bis(4,4'-methylenedicyclohexylaminium) [mu]-benzene-1,4-dicarboxylato-bis[trichloridozinc(II)] tetrahydrate

aDepartment of Chemistry, Chung-Yuan Christian University, Chung-Li 320, Taiwan
Correspondence e-mail: chiaher@cycu.edu.tw

The title compound, (C13H28N2)2[Zn2(C8H4O4)Cl6]·4H2O, was prepared by the reaction of ZnCl2·6H2O, benzene-1,4-dicarboxylic acid and 4,4'-diaminodicyclohexylmethane in methanol. The [Zn2Cl6(C8H4O4)]4- anions lie on centres of inversion and comprise two ZnCl3 groups bridged by benzene-1,4-dicarboxylate. In addition to N-H...Cl and N-H...O hydrogen bonds between the cations and anions, solvent water molecules form O-H...O and O-H...Cl hydrogen bonds to give a three-dimensional network.

Related literature

For related structures, see: Clausen et al. (2005[Clausen, H. F., Poulsen, R. D., Bond, A. D., Chevallier, M.-A. S. & Iversen, B. B. (2005). J. Solid State Chem. 178, 3342-3351.]); Thirumurugan & Rao (2005[Thirumurugan, A. & Rao, C. N. R. (2005). J. Mater. Chem. 15, 3852-3858.]); Li et al. (1998[Li, H., Eddaoudi, M., Groy, T. L. & Yaghi, O. M. (1998). J. Am. Chem. Soc. 120, 8571-8572.], 1999[Li, H., Eddaoudi, M., O'Keeffe, M. & Yaghi, O. M. (1999). Nature (London), 402, 276-279.]).

[Scheme 1]

Experimental

Crystal data
  • (C13H28N2)2[Zn2(C8H4O4)Cl6]·4H2O

  • Mr = 1004.36

  • Monoclinic, P 21 /c

  • a = 14.264 (3) Å

  • b = 14.202 (2) Å

  • c = 11.712 (2) Å

  • [beta] = 100.498 (16)°

  • V = 2333.0 (7) Å3

  • Z = 2

  • Mo K[alpha] radiation

  • [mu] = 1.42 mm-1

  • T = 295 (2) K

  • 0.70 × 0.40 × 0.10 mm

Data collection
  • Bruker P4 diffractometer

  • Absorption correction: [psi] scan (XSCANS; Siemens, 1995[Siemens (1995). XSCANS. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]) Tmin = 0.694, Tmax = 0.868

  • 5093 measured reflections

  • 4071 independent reflections

  • 3405 reflections with I > 2[sigma](I)

  • Rint = 0.027

  • 3 standard reflections every 97 reflections intensity decay: none

Refinement
  • R[F2 > 2[sigma](F2)] = 0.057

  • wR(F2) = 0.132

  • S = 1.05

  • 4071 reflections

  • 244 parameters

  • 2 restraints

  • H-atom parameters constrained

  • [Delta][rho]max = 1.10 e Å-3

  • [Delta][rho]min = -0.83 e Å-3

Table 1
Hydrogen-bond geometry (Å, °)

D-H...A D-H H...A D...A D-H...A
N1-H1A...Cl3 0.89 2.41 3.252 (4) 159
N1-H1B...Cl2i 0.89 2.51 3.290 (4) 147
N1-H1C...O3i 0.89 1.94 2.828 (5) 178
N2-H2A...Cl1ii 0.89 2.95 3.725 (5) 146
N2-H2A...Cl2ii 0.89 2.67 3.321 (4) 131
N2-H2B...O2iii 0.89 2.06 2.928 (4) 166
N2-H2C...O4iv 0.89 1.95 2.813 (4) 164
O3-H3B...O2 1.00 1.81 2.798 (4) 167.8
O3-H3C...Cl1v 1.06 2.24 3.262 (4) 160.3
O4-H4B...Cl3 0.98 2.21 3.172 (4) 164.9
O4-H4C...Cl2vi 0.94 2.38 3.258 (3) 154.9
Symmetry codes: (i) [x, -y+{\script{3\over 2}}, z+{\script{1\over 2}}]; (ii) x-1, y, z; (iii) -x, -y+1, -z; (iv) [-x, y+{\script{1\over 2}}, -z+{\script{1\over 2}}]; (v) -x+1, -y+1, -z; (vi) -x+1, -y+1, -z+1.

Data collection: XSCANS (Siemens, 1995[Siemens (1995). XSCANS. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]); cell refinement: XSCANS; data reduction: SHELXTL (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: SHELXTL; software used to prepare material for publication: SHELXTL.


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: BI2304 ).


Acknowledgements

The authors are grateful to the National Science Council of Taiwan for support. This research was also supported by the Project of the Specific Research Fields in Chung Yuan Christian University, Taiwan, under grant No. CYCU-97-CR-CH.

References

Clausen, H. F., Poulsen, R. D., Bond, A. D., Chevallier, M.-A. S. & Iversen, B. B. (2005). J. Solid State Chem. 178, 3342-3351.  [ISI] [CSD] [CrossRef] [ChemPort]
Li, H., Eddaoudi, M., Groy, T. L. & Yaghi, O. M. (1998). J. Am. Chem. Soc. 120, 8571-8572.  [ISI] [CrossRef] [ChemPort]
Li, H., Eddaoudi, M., O'Keeffe, M. & Yaghi, O. M. (1999). Nature (London), 402, 276-279.  [ChemPort]
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]
Siemens (1995). XSCANS. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
Thirumurugan, A. & Rao, C. N. R. (2005). J. Mater. Chem. 15, 3852-3858.  [ISI] [CSD] [CrossRef] [ChemPort]


Acta Cryst (2008). E64, m1412  [ doi:10.1107/S1600536808033011 ]

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