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Volume 65 
Part 2 
Page o305  
February 2009  

Received 9 December 2008
Accepted 8 January 2009
Online 14 January 2009

Key indicators
Single-crystal X-ray study
T = 298 K
Mean [sigma](C-C) = 0.005 Å
R = 0.062
wR = 0.168
Data-to-parameter ratio = 14.2
Details
Open access

Ethyl 1-[(4-acetyl-2-methoxyphenoxy)methyl]cyclopropane-1-carboxylate

aDepartment of Applied Chemistry, College of Science, Nanjing University of Technology, Nanjing 210009, People's Republic of China,bDepartment of Chemical Engineering, Chien-shlung Institute of Technology, Taicang 215411, People's Republic of China, and cDepartment of Applied Chemistry, Nanjing College of Chemical Technology, No. 625 Geguan Road, Dachang, Nanjing 210048, People's Republic of China
Correspondence e-mail: mhf2356@yahoo.com.cn

In the title compound, C16H20O5, the dihedral angle between the planar rings, viz. benzene and cyclopropane, is 52.1 (2)°. Molecules are connected in the crystal via weak intermolecular C-H...O hydrogen bonds, forming chains in the [001] direction.

Related literature

For details of the synthesis, see: Chen (2008[Chen, G. P. (2008). Advenchen Laboratories, LLC, USA. WO Patent No. 2008112407.]).

[Scheme 1]

Experimental

Crystal data
  • C16H20O5

  • Mr = 292.32

  • Monoclinic, P 21 /c

  • a = 12.663 (3) Å

  • b = 8.5020 (17) Å

  • c = 14.676 (3) Å

  • [beta] = 107.25 (3)°

  • V = 1509.0 (5) Å3

  • Z = 4

  • Mo K[alpha] radiation

  • [mu] = 0.10 mm-1

  • T = 298 (2) K

  • 0.20 × 0.10 × 0.10 mm

Data collection
  • Enraf-Nonius CAD-4 diffractometer

  • Absorption correction: [psi] scan (North et al., 1968[North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.]) Tmin = 0.981, Tmax = 0.991

  • 2874 measured reflections

  • 2732 independent reflections

  • 1473 reflections with I > 2[sigma](I)

  • Rint = 0.039

  • 3 standard reflections every 200 reflections intensity decay: 1%

Refinement
  • R[F2 > 2[sigma](F2)] = 0.062

  • wR(F2) = 0.168

  • S = 0.93

  • 2732 reflections

  • 193 parameters

  • H-atom parameters constrained

  • [Delta][rho]max = 0.22 e Å-3

  • [Delta][rho]min = -0.20 e Å-3

Table 1
Hydrogen-bond geometry (Å, °)

D-H...A D-H H...A D...A D-H...A
C7-H7A...O1i 0.93 2.56 3.329 (4) 140
Symmetry code: (i) [x, -y+{\script{1\over 2}}, z-{\script{1\over 2}}].

Data collection: CAD-4 Software (Enraf-Nonius, 1985[Enraf-Nonius (1985). CAD-4 Software. Enraf-Nonius, Delft, The Netherlands.]); cell refinement: CAD-4 Software; data reduction: XCAD4 (Harms & Wocadlo, 1995[Harms, K. & Wocadlo, S. (1995). XCAD4. University of Marburg, Germany.]); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: SHELXTL (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); software used to prepare material for publication: SHELXTL.


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: BH2213 ).


Acknowledgements

The authors thank the Center of Testing and Analysis, Nanjing University, for support.

References

Chen, G. P. (2008). Advenchen Laboratories, LLC, USA. WO Patent No. 2008112407.
Enraf-Nonius (1985). CAD-4 Software. Enraf-Nonius, Delft, The Netherlands.
Harms, K. & Wocadlo, S. (1995). XCAD4. University of Marburg, Germany.
North, A. C. T., Phillips, D. C. & Mathews, F. S. (1968). Acta Cryst. A24, 351-359.  [CrossRef] [details]
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]


Acta Cryst (2009). E65, o305  [ doi:10.1107/S1600536809000956 ]

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