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Volume 65 
Part 4 
Page o824  
April 2009  

Received 16 February 2009
Accepted 9 March 2009
Online 25 March 2009

Key indicators
Single-crystal X-ray study
T = 291 K
Mean [sigma](C-C) = 0.002 Å
R = 0.044
wR = 0.135
Data-to-parameter ratio = 15.2
Details
Open access

4,4'-(1,2,4,5-Tetrazine-3,6-diyl)dibenzonitrile

aDepartment of Chemistry, Adam Mickiewicz University, Grunwaldzka 6, 60-780 Poznan, Poland
Correspondence e-mail: borowiak@amu.edu.pl

Molecules of the title compound, C16H8N6, lie on crystallographic inversion centres. A dihedral angle of 16.1 (1)° is formed between the central tetrazine ring and the plane of each cyanophenyl group. The molecules form stacks along [100] with a perpendicular interplanar separation of 3.25 (1) Å. C-H...N interactions are formed between molecules in neighbouring stacks.

Related literature

For synthesis details, see: Spychala et al. (1994[Spychala, J., Boykin, D. W., Wilson, W. D., Zhao, M., Tidwell, R. R., Dykstra, C. C., Hall, J. E., Jones, S. K. & Schinazi, R. F. (1994). Eur. J. Med. Chem. 29, 363-367.], 2000[Spychala, J. (2000). Synth. Commun. 30, 1083-1094.]). For related structures and discussion, see: Higashi & Osaki (1981[Higashi, T. & Osaki, K. (1981). Acta Cryst. B37, 777-779.]); Infantes et al. (2003[Infantes, L., Mahon, M. F., Male, L., Raithby, P. R., Teat, S. J., Sauer, J., Jagerovic, N., Elguero, J. & Motherwell, S. (2003). Helv. Chim. Acta, 86, 1205-1221.]).

[Scheme 1]

Experimental

Crystal data
  • C16H8N6

  • Mr = 284.28

  • Monoclinic, P 21 /c

  • a = 4.8447 (5) Å

  • b = 12.1054 (12) Å

  • c = 11.6927 (11) Å

  • [beta] = 94.363 (8)°

  • V = 683.75 (12) Å3

  • Z = 2

  • Mo K[alpha] radiation

  • [mu] = 0.09 mm-1

  • T = 291 K

  • 0.45 × 0.2 × 0.1 mm

Data collection
  • Kuma KM-4-CCD diffractometer

  • Absorption correction: multi-scan (CrysAlis RED; Oxford Diffraction, 2007[Oxford Diffraction (2007). CrysAlis CCD and CrysAlis RED. Oxford Diffraction Poland, Wroclaw, Poland.]) Tmin = 0.925, Tmax = 0.991

  • 5912 measured reflections

  • 1768 independent reflections

  • 1094 reflections with I > 2[sigma](I)

  • Rint = 0.017

Refinement
  • R[F2 > 2[sigma](F2)] = 0.044

  • wR(F2) = 0.135

  • S = 1.06

  • 1768 reflections

  • 116 parameters

  • All H-atom parameters refined

  • [Delta][rho]max = 0.16 e Å-3

  • [Delta][rho]min = -0.13 e Å-3

Table 1
Hydrogen-bond geometry (Å, °)

D-H...A D-H H...A D...A D-H...A
C6-H6...N10i 0.989 (17) 2.539 (17) 3.370 (2) 141.6 (13)
C8-H8...N2ii 0.956 (17) 2.850 (17) 3.6106 (19) 137.2 (12)
C9-H9...N10iii 0.993 (17) 2.754 (17) 3.431 (2) 125.8 (12)
Symmetry codes: (i) -x+2, -y+1, -z; (ii) [x+1, -y+{\script{1\over 2}}, z+{\script{1\over 2}}]; (iii) [-x+2, y-{\script{1\over 2}}, -z+{\script{1\over 2}}].

Data collection: CrysAlis CCD (Oxford Diffraction, 2007[Oxford Diffraction (2007). CrysAlis CCD and CrysAlis RED. Oxford Diffraction Poland, Wroclaw, Poland.]); cell refinement: CrysAlis RED (Oxford Diffraction, 2007[Oxford Diffraction (2007). CrysAlis CCD and CrysAlis RED. Oxford Diffraction Poland, Wroclaw, Poland.]); data reduction: CrysAlis RED; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: Stereochemical Workstation Operation Manual (Siemens, 1989[Siemens (1989). Stereochemical Workstation Operation Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]) and Mercury (Macrae et al., 2006[Macrae, C. F., Edgington, P. R., McCabe, P., Pidcock, E., Shields, G. P., Taylor, R., Towler, M. & van de Streek, J. (2006). J. Appl. Cryst. 39, 453-457.]); software used to prepare material for publication: SHELXL97.


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: BI2354 ).


Acknowledgements

This work was supported by funds from Adam Mickiewicz University, Faculty of Chemistry.

References

Higashi, T. & Osaki, K. (1981). Acta Cryst. B37, 777-779.  [CrossRef] [details]
Infantes, L., Mahon, M. F., Male, L., Raithby, P. R., Teat, S. J., Sauer, J., Jagerovic, N., Elguero, J. & Motherwell, S. (2003). Helv. Chim. Acta, 86, 1205-1221.  [CSD] [CrossRef] [ChemPort]
Macrae, C. F., Edgington, P. R., McCabe, P., Pidcock, E., Shields, G. P., Taylor, R., Towler, M. & van de Streek, J. (2006). J. Appl. Cryst. 39, 453-457.  [ISI] [CrossRef] [ChemPort] [details]
Oxford Diffraction (2007). CrysAlis CCD and CrysAlis RED. Oxford Diffraction Poland, Wroclaw, Poland.
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]
Siemens (1989). Stereochemical Workstation Operation Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
Spychala, J. (2000). Synth. Commun. 30, 1083-1094.
Spychala, J., Boykin, D. W., Wilson, W. D., Zhao, M., Tidwell, R. R., Dykstra, C. C., Hall, J. E., Jones, S. K. & Schinazi, R. F. (1994). Eur. J. Med. Chem. 29, 363-367.


Acta Cryst (2009). E65, o824  [ doi:10.1107/S1600536809008599 ]

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