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Volume 65 
Part 8 
Pages i56-i57  
August 2009  

Received 11 June 2009
Accepted 29 June 2009
Online 4 July 2009

Key indicators
Single-crystal X-ray study
T = 290 K
Mean [sigma](S-P) = 0.004 Å
Disorder in main residue
R = 0.045
wR = 0.109
Data-to-parameter ratio = 16.5
Details

Redetermination of AgNb2PS10 revealing a silver deficiency

aDepartment of Chemistry, Konkuk University, Seoul 143-701, Republic of Korea, and bDivision of Energy Systems Research and Department of Chemistry, Ajou University, Suwon 443-749, Republic of Korea
Correspondence e-mail: hsyun@ajou.ac.kr

In comparison with a previous crystallographic study [Goh et al. (2002[Goh, E., Kim, S. & Jung, D. (2002). J. Solid State Chem. 168, 119-125.]). J. Solid State Chem. 168, 119-125] of the title compound, silver diniobium tris(disulfide) tetrathiophosphate(V), that reports a full occupation of the silver position and isotropic displacement parameters for the atoms, the current redetermination reveals a silver deficiency with a site-occupation factor of 0.88 (1) and reports all atoms with anisotropic displacement parameters. The structure of Ag0.88Nb2PS10 is composed of [infinity]1[Nb2PS10] chains, which are built up from pairs of distorted bicapped trigonal-prismatic [NbS8] polyhedra forming [Nb2S12] dimers and of tetrahedral [PS4] groups. These chains are connected via the statistically disordered Ag+ ions, forming double layers. Adjacent layers are stacked solely through van der Waals forces into a three-dimensional structure. Short and long Nb-Nb distances [2.880 (1) and 3.770 (2) Å, respectively] alternate along the chain and S22- and S2- anionic species are observed.

Related literature

The synthesis and structural characterization of stoichiometric AgNb2PS10 and NaNb2PS10 have been published (Goh et al., 2002). For Nb2PS10-related quaternary thiophosphates with general formula MNb2PS10, see: Do & Yun (1996[Do, J. & Yun, H. (1996). Inorg. Chem. 35, 3729-3730.]) for KNb2PS10, Kim & Yun (2002[Kim, C.-K. & Yun, H.-S. (2002). Acta Cryst. C58, i53-i54.]) for RbNb2PS10, Kwak et al. (2007[Kwak, J., Kim, C., Yun, H. & Do, J. (2007). Bull. Kor. Chem. Soc. 28, 701-704.]) for CsNb2PS10, and Bang et al. (2008[Bang, H., Kim, Y., Kim, S. & Kim, S. (2008). J. Solid State Chem. 181, 1978-1802.]) for TlNb2PS10; for related pentanary thiophosphates M,M'Nb2PS10, see: Kwak & Yun (2008[Kwak, J. & Yun, H. (2008). Bull. Kor. Chem. Soc. 29, 273-275.]) for K0.34Cu0.5Nb2PS10, Dong et al. (2005a[Dong, Y., Kim, S., Yun, H. & Lim, H. (2005a). Bull. Kor. Chem. Soc. 26, 309-311.]) for K0.5Ag0.5Nb2PS10, and Dong et al. (2005b[Dong, Y., Kim, S. & Yun, H. (2005b). Acta Cryst. C61, i25-i26.]) for Rb0.38Ag0.5Nb2PS10. For data standardization, see: Gelato & Parthé (1987[Gelato, L. M. & Parthé, E. (1987). J. Appl. Cryst. 20, 139-143.]). For ionic radii, see: Shannon (1976[Shannon, R. D. (1976). Acta Cryst. A32, 751-767.]). For structure validation, see: Spek (2009[Spek, A. L. (2009). Acta Cryst. D65, 148-155.]). For typical P-S bond distances, see: Brec et al. (1983[Brec, R., Grenouilleau, P., Evain, M. & Rouxel, J. (1983). Rev. Chim. Mineral. 20, 295-304.]). For typical Nb4+-Nb4+ bond distances, see: Angenault et al. (2000[Angenault, J., Cieren, X. & Quarton, M. (2000). J. Solid State Chem. 153, 55-65.]).

Experimental

Crystal data
  • Ag0.88Nb2PS10

  • Mr = 631.78

  • Monoclinic, C 2/c

  • a = 24.001 (5) Å

  • b = 7.7711 (17) Å

  • c = 12.960 (3) Å

  • [beta] = 94.833 (19)°

  • V = 2408.6 (9) Å3

  • Z = 8

  • Mo K[alpha] radiation

  • [mu] = 5.1 mm-1

  • T = 290 K

  • 0.60 × 0.06 × 0.04 mm

Data collection
  • MAC Science MXC3 diffractometer

  • Absorption correction: analytical (de Meulenaer & Tompa, 1965[Meulenaer, J. de & Tompa, H. (1965). Acta Cryst. 19, 1014-1018.]) Tmin = 0.727, Tmax = 0.821

  • 2221 measured reflections

  • 2114 independent reflections

  • 1835 reflections with I > 2[sigma](I)

  • Rint = 0.017

  • 2 standard reflections every 100 reflections intensity decay: none

Refinement
  • R[F2 > 2[sigma](F2)] = 0.045

  • wR(F2) = 0.109

  • S = 1.16

  • 2114 reflections

  • 128 parameters

  • [Delta][rho]max = 1.82 e Å-3

  • [Delta][rho]min = -1.20 e Å-3

Table 1
Selected geometric parameters (Å, °)

Ag-S1i 2.536 (3)
Ag-S9ii 2.620 (3)
Ag-S2iii 2.875 (3)
Ag-S8iv 2.916 (3)
Ag-S1iii 2.965 (4)
Ag-S3 3.091 (3)
Nb1-S5 2.462 (2)
Nb1-S2v 2.466 (2)
Nb1-S7vi 2.518 (3)
Nb1-S6iv 2.551 (2)
Nb1-S3 2.554 (3)
Nb1-S4v 2.562 (2)
Nb1-S8iv 2.573 (3)
Nb1-S10iv 2.659 (2)
Nb2-S3ii 2.476 (3)
Nb2-S7 2.479 (3)
Nb2-S5ii 2.508 (2)
Nb2-S2vii 2.551 (3)
Nb2-S4ii 2.558 (2)
Nb2-S6 2.569 (3)
Nb2-S9 2.630 (3)
Nb2-S10 2.656 (2)
P-S1vi 2.009 (4)
P-S8 2.048 (4)
P-S9 2.059 (4)
P-S10 2.065 (3)
S1vi-P-S8 108.46 (17)
S1vi-P-S9 112.81 (17)
S8-P-S9 111.87 (16)
S1vi-P-S10 117.65 (16)
S8-P-S10 104.24 (14)
S9-P-S10 101.46 (14)
Symmetry codes: (i) [-x, y, -z+{\script{1\over 2}}]; (ii) [-x+{\script{1\over 2}}, y+{\script{1\over 2}}, -z+{\script{1\over 2}}]; (iii) [x, -y+1, z-{\script{1\over 2}}]; (iv) [-x+{\script{1\over 2}}, -y+{\script{1\over 2}}, -z]; (v) [x, -y, z-{\script{1\over 2}}]; (vi) [-x+{\script{1\over 2}}, y-{\script{1\over 2}}, -z+{\script{1\over 2}}]; (vii) [-x+{\script{1\over 2}}, -y+{\script{1\over 2}}, -z+1].

Data collection: MAC Science MXC3 (MAC Science, 1994[MAC Science (1994). MXC Diffractometer Control Software. Mac Science Corporation, Tokyo, Japan.]); cell refinement: MAC Science MXC3; data reduction: MAC Science MXC3; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: locally modified version of ORTEP (Johnson, 1965[Johnson, C. K. (1965). ORTEP. Report ORNL-3794. Oak Ridge National Laboratory, Tennessee, USA.]); software used to prepare material for publication: WinGX (Farrugia, 1999[Farrugia, L. J. (1999). J. Appl. Cryst. 32, 837-838.]).


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: WM2240 ).


Acknowledgements

This work was supported by a Korea Research Foundation Grant funded by the Korean Government (MOEHRD) (KRF-2007-412-J04001). Use was made of the X-ray facilities supported by Ajou University.

References

Angenault, J., Cieren, X. & Quarton, M. (2000). J. Solid State Chem. 153, 55-65.  [CrossRef] [ChemPort]
Bang, H., Kim, Y., Kim, S. & Kim, S. (2008). J. Solid State Chem. 181, 1978-1802.  [CrossRef]
Brec, R., Grenouilleau, P., Evain, M. & Rouxel, J. (1983). Rev. Chim. Mineral. 20, 295-304.  [ChemPort]
Do, J. & Yun, H. (1996). Inorg. Chem. 35, 3729-3730.  [CrossRef] [PubMed] [ChemPort]
Dong, Y., Kim, S. & Yun, H. (2005b). Acta Cryst. C61, i25-i26.  [CrossRef] [details]
Dong, Y., Kim, S., Yun, H. & Lim, H. (2005a). Bull. Kor. Chem. Soc. 26, 309-311.  [ChemPort]
Farrugia, L. J. (1999). J. Appl. Cryst. 32, 837-838.  [CrossRef] [details]
Gelato, L. M. & Parthé, E. (1987). J. Appl. Cryst. 20, 139-143.  [CrossRef] [details]
Goh, E., Kim, S. & Jung, D. (2002). J. Solid State Chem. 168, 119-125.  [CrossRef] [ChemPort]
Johnson, C. K. (1965). ORTEP. Report ORNL-3794. Oak Ridge National Laboratory, Tennessee, USA.
Kim, C.-K. & Yun, H.-S. (2002). Acta Cryst. C58, i53-i54.  [CrossRef] [details]
Kwak, J., Kim, C., Yun, H. & Do, J. (2007). Bull. Kor. Chem. Soc. 28, 701-704.  [ChemPort]
Kwak, J. & Yun, H. (2008). Bull. Kor. Chem. Soc. 29, 273-275.  [ChemPort]
MAC Science (1994). MXC Diffractometer Control Software. Mac Science Corporation, Tokyo, Japan.
Meulenaer, J. de & Tompa, H. (1965). Acta Cryst. 19, 1014-1018.  [CrossRef] [details]
Shannon, R. D. (1976). Acta Cryst. A32, 751-767.  [CrossRef] [details]
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]
Spek, A. L. (2009). Acta Cryst. D65, 148-155.  [CrossRef] [details]


Acta Cryst (2009). E65, i56-i57   [ doi:10.1107/S1600536809025100 ]

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