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Volume 65 
Part 10 
Page o2579  
October 2009  

Received 18 September 2009
Accepted 25 September 2009
Online 30 September 2009

Key indicators
Single-crystal X-ray study
T = 298 K
Mean [sigma](C-C) = 0.003 Å
R = 0.041
wR = 0.107
Data-to-parameter ratio = 12.0
Details
Open access

3-[(3-Oxo-1,3-dihydroisobenzofuran-1-yl)amino]benzoic acid

aCollege of Chemistry and Chemical Engineering, Liaocheng University, Shandong 252059, People's Republic of China
Correspondence e-mail: handongyin@163.com

In the title compound, C15H11NO4, the dihedral angle formed by the benzene ring and isobenzofuran ring system is 67.82 (5) Å. The crystal structure is stabilized by intermolecular O-H...O and N-H...O hydrogen-bonding interactions.

Related literature

For general background to isobenzofuran derivatives, see: Landge et al. (2008[Landge, S. M., Berryman, M. & Törk, B. (2008). Tetrahedron Lett. 49, 4505-4508.]); Paradkar et al. (1998[Paradkar, M. V., Ranade, A. A., Kulkarni, M. S., Godbole, H. M. & Joseph, A. R. (1998). J. Chem. Res. (S), pp. 332-333.]); Joseph (1998[Joseph, A. R. (1998). J. Chem. Res. (S), pp. 332-333.]). Odabasoglu & Büyükgüngör (2008[Odabasoglu, M. & Büyükgüngör, O. (2008). Acta Cryst. E64, o752-o753.]).

[Scheme 1]

Experimental

Crystal data
  • C15H11NO4

  • Mr = 269.25

  • Monoclinic, P 21 /n

  • a = 10.9025 (15) Å

  • b = 8.1595 (12) Å

  • c = 14.2654 (18) Å

  • [beta] = 103.463 (1)°

  • V = 1234.2 (3) Å3

  • Z = 4

  • Mo K[alpha] radiation

  • [mu] = 0.11 mm-1

  • T = 298 K

  • 0.27 × 0.19 × 0.17 mm

Data collection
  • Siemens SMART CCD area-detector diffractometer

  • Absorption correction: multi-scan (SADABS; Sheldrick, 1996[Sheldrick, G. M. (1996). SADABS. University of Göttingen, Germany.]) Tmin = 0.972, Tmax = 0.982

  • 6011 measured reflections

  • 2171 independent reflections

  • 1206 reflections with I > 2[sigma](I)

  • Rint = 0.038

Refinement
  • R[F2 > 2[sigma](F2)] = 0.041

  • wR(F2) = 0.107

  • S = 0.90

  • 2171 reflections

  • 181 parameters

  • H-atom parameters constrained

  • [Delta][rho]max = 0.23 e Å-3

  • [Delta][rho]min = -0.13 e Å-3

Table 1
Hydrogen-bond geometry (Å, °)

D-H...A D-H H...A D...A D-H...A
O1-H1A...O4i 0.82 1.91 2.712 (2) 166
N1-H1...O2ii 0.86 2.16 2.956 (2) 154
Symmetry codes: (i) [-x+{\script{3\over 2}}, y+{\script{1\over 2}}, -z+{\script{5\over 2}}]; (ii) [x-{\script{1\over 2}}, -y+{\script{1\over 2}}, z-{\script{1\over 2}}].

Data collection: SMART (Siemens, 1996[Siemens (1996). SMART and SAINT. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]); cell refinement: SAINT (Siemens, 1996[Siemens (1996). SMART and SAINT. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]); data reduction: SAINT; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: SHELXTL (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); software used to prepare material for publication: SHELXTL.


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: BQ2162 ).


Acknowledgements

We acknowledge the financial support of the Natural Science Foundation of China (No. 20771053) and the Natural Science Foundation of Shandong Province (Y2008B48). This work was also supported by the `Students Technology Cultural Innovation Fund' of Liaocheng University.

References

Joseph, A. R. (1998). J. Chem. Res. (S), pp. 332-333.
Landge, S. M., Berryman, M. & Törk, B. (2008). Tetrahedron Lett. 49, 4505-4508.  [ISI] [CrossRef] [ChemPort]
Odabasoglu, M. & Büyükgüngör, O. (2008). Acta Cryst. E64, o752-o753.  [CrossRef] [details]
Paradkar, M. V., Ranade, A. A., Kulkarni, M. S., Godbole, H. M. & Joseph, A. R. (1998). J. Chem. Res. (S), pp. 332-333.  [ISI] [CrossRef]
Sheldrick, G. M. (1996). SADABS. University of Göttingen, Germany.
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]
Siemens (1996). SMART and SAINT. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.


Acta Cryst (2009). E65, o2579  [ doi:10.1107/S1600536809038926 ]

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