Caesium europium(III) polyphosphate, CsEu(PO3)4

Zhu, J.; Cheng, W.-D.; Zhang, H.

doi:10.1107/S1600536809036058

Volume 65
Part 10
Page i70
October 2009

Received 1 September 2009
Accepted 7 September 2009
Online 12 September 2009

Key indicators
Single-crystal X-ray study
T = 293 K
Mean (Eu-O) = 0.003 Å
R = 0.019
wR = 0.048
Data-to-parameter ratio = 13.9
Details

Caesium europium(III) polyphosphate, CsEu(PO₃)₄

Jing Zhu,^a ^* Wen-Dan Cheng ^b and Hao Zhang ^b

^aDepartment of Materials Science and Engineering, Yunnan University, Kunming, Yunnan 650091, People's Republic of China, and ^bState Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou, Fujian 350002, People's Republic of China
Correspondence e-mail: jzhu@ynu.edu.cn

Caesium europium polyphosphate, CsEu(PO₃)₄, was synthesized by a high-temperature solution reaction. Its structure is charaterized by a three-dimensional framework made up of double PO₄ spiral chains and EuO₈ and CsO₁₁ polyhedra.

Related literature

For the structures, properties and applications of condensed alkaline metal-rare earth polyphosphates with the general formula MLn(PO₃)₄ (M = alkali metal, Ln = rare earth metal), see: Chinn & Hong (1975); Ettis et al. (2003); Hong (1975); Koizumi (1976); Koizumi & Nakano (1978); Maksimova et al. (1982); Naïli & Mhiri (2005); Otsuka et al. (1977); Palkina et al. (1978); Rekik et al. (2004); Tsujimoto et al. (1977).

Experimental

Crystal data

CsEu(PO₃)₄
M_r = 600.75
Monoclinic, P 2₁ /n
a = 10.3571 (9) Å
b = 8.9615 (5) Å
c = 11.1957 (8) Å
= 106.354 (3)°
V = 997.09 (13) Å³
Z = 4
Mo K radiation
= 10.60 mm^-1
T = 293 K
0.25 × 0.20 × 0.15 mm

Data collection

Bruker P4 diffractometer
Absorption correction: -scan (XSCANS; Bruker, 1996) T_min = 0.545, T_max = 1.000
7446 measured reflections
2284 independent reflections
2185 reflections with I > 2(I)
R_int = 0.025
3 standard reflections every 97 reflections intensity decay: none

Refinement

R[F² > 2(F²)] = 0.019
wR(F²) = 0.048
S = 1.00
2284 reflections
164 parameters
_max = 1.16 e Å^-3
_min = -1.17 e Å^-3

Data collection: XSCANS (Bruker, 1996); cell refinement: XSCANS; data reduction: SHELXTL (Sheldrick, 2008); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: SHELXTL; software used to prepare material for publication: SHELXTL.

Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: BT5050 ).

Acknowledgements

This investigation was based on work supported by the Foundation of Yunnan University (project No. 2007Q013B), the National Natural Science Foundation of China (project No. 20901066) and the Education Science Foundation of Yunnan Province. We thank Dr Qingyan Liu for fruitful discussions concerning the crystal structure.

References

Bruker (1996). XSCANS. Bruker AXS Inc., Madison, Wisconsin, USA.
Chinn, S. R. & Hong, H. Y. P. (1975). Appl. Phys. Lett. 26, 649-651.
Ettis, H., Naïli, H. & Mhiri, T. (2003). Cryst. Growth Des. 3, 599-602.
Hong, H. Y. P. (1975). Mater. Res. Bull. 10, 1105-1110.
Koizumi, H. (1976). Acta Cryst. B32, 266-268.
Koizumi, H. & Nakano, J. (1978). Acta Cryst. B34, 3320-3323.
Maksimova, S. I., Palkina, K. K., Chibiskova, N. T. & Kuznetsov, V. G. (1982). Izv. Akad. Nauk. SSSR, Neorg. Mater. 18, 653-659.
Naïli, H. & Mhiri, T. (2005). Acta Cryst. E61, i204-i207.
Otsuka, K., Miyazawa, S., Yamada, T., Iwasaki, H. & Nakano, J. (1977). J. Appl. Phys. 48, 2099-2101.
Palkina, K. K., Maksimova, S. I. & Kuznetsov, V. G. (1978). Izv. Akad. Nauk. SSSR, Neorg. Mater. 14, 284-287.
Rekik, W., Naïli, H. & Mhiri, T. (2004). Acta Cryst. C60, i50-i52.
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.
Tsujimoto, Y., Fukuda, Y. & Fukai, M. (1977). J. Electrochem. Soc. 124, 553-556.

inorganic compounds