Volume 65 Received 30 July 2009 | ||||||||||
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aFacultad de Ciencias Químicas, UANL, Licenciatura en Química Industrial, Ciudad Universitaria, Monterrey, NL, Mexico,bDEP Facultad de Ciencias Químicas, UANL, Guerrero y Progreso S/N, Col. Treviño, 64570 Monterrey, NL, Mexico,cLab. Síntesis de Complejos, Facultad de Ciencias Químicas, Universidad Autónoma de Puebla, PO Box 1067, 72001 Puebla, Pue., Mexico, and dInstituto de Química-UNAM, Circuito exterior, Cd. Universitaria, Coyoacán, CP 04510, México, DF, Mexico
Correspondence e-mail: sylvain_bernes@hotmail.com
The title compound, C32H28N2, is a chiral bis-imine in which both imine groups display the common E configuration. The naphthyl groups present different orientations with respect to the central core, as reflected in the dihedral angles of 21.4 (2) and 78.83 (14)° between the benzene and naphthyl mean planes, thus the highest possible C2 local molecular symmetry is not attained. This C1 molecular conformation allows multiple C-H
intermolecular contacts involving all aromatic rings, while no
-
interactions are available for the stabilization of the crystal structure. The resulting packing structure is based on molecules stacked along [100].
For solvent-free synthesis in organic chemistry, see: Jeon et al. (2005
); Noyori (2005
); Tanaka & Toda (2000
); Tovar et al. (2007
). For related chiral Schiff bases constructed from a bis-substituted benzene core, see: Allouchi et al. (1994
); Hamaker & Oberts (2006
); Espinosa Leija et al. (2009
). For the use of the enantiomer of the title compound as a chiral dopant for liquid crystals, see: Watanabe & Fukuda (2008
).
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Data collection: XSCANS (Siemens, 1996
); cell refinement: XSCANS; data reduction: XSCANS; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008
); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008
); molecular graphics: Mercury (Macrae et al., 2006
); software used to prepare material for publication: SHELXL97.
Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: LH2874 ).
Partial support from VIEP-UAP (GUPJ-NAT08-G) and SEP/PIFI-3 (CA-150 2006-22-08) is acknowledged.
Allouchi, H., Bideau, J. P., Cotrait, M., Destrade, Ch. & Nguyen, H. T. (1994). Mol. Cryst. Liq. Cryst. Sci. Technol. Sect. A, 239, 153-164.
![[ChemPort]](../../../../../../logos/chemportborder.gif)
Espinosa Leija, A., Hernández, G., Cruz, S., Bernès, S. & Gutiérrez, R. (2009). Acta Cryst. E65, o1316.
![[details]](../../../../../../e/graphics/details.gif)
Hamaker, C. G. & Oberts, B. P. (2006). J. Chem. Crystallogr. 36, 735-742.
![[ChemPort]](../../../../../../logos/chemportborder.gif)
Jeon, S.-J., Li, H. & Walsh, P. J. (2005). J. Am. Chem. Soc. 127, 16416-16425.
![[ChemPort]](../../../../../../logos/chemportborder.gif)
Macrae, C. F., Edgington, P. R., McCabe, P., Pidcock, E., Shields, G. P., Taylor, R., Towler, M. & van de Streek, J. (2006). J. Appl. Cryst. 39, 453-457.
![[details]](../../../../../../j/graphics/details.gif)
Noyori, R. (2005). Chem. Commun. pp. 1807-1811. ![[CrossRef]](../../../../../../logos/crossrefborder.gif)
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.
![[details]](../../../../../../a/graphics/details.gif)
Siemens (1996). XSCANS. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
Tanaka, K. & Toda, F. (2000). Chem. Rev. 100, 1025-1074.
![[ChemPort]](../../../../../../logos/chemportborder.gif)
Tovar, A., Penña, U., Hernández, G., Portillo, R. & Gutiérrez, R. (2007). Synthesis, pp. 22-24.
Watanabe, J. & Fukuda, K. (2008). Jpn. Kokai Tokkyo Koho Patent JP 2008106201.