(E)-N′-(2-Chlorobenzylidene)-4-methoxybenzohydrazide

The molecule of the title compound, C15H13ClN2O2, adopts an E geometry about the C=N bond. The dihedral angle between the two benzene rings is 62.7 (2)°. In the crystal structure, molecules are linked through intermolecular N—H⋯O hydrogen bonds, forming chains running along the c axis.

The molecule of the title compound adopts an E geometry about the C7═N1 bond. The dihedral angle between the C1-C6 and C9-C14 benzene rings is 62.7 (2)°.
In the crystal structure, molecules are linked through intermolecular N-H···O hydrogen bonds (Table 1) to form chains running along the c axis (Fig. 2).

Experimental
Equimolar quantities of 2-chlorobenzaldehyde and 4-methoxybenzohydrazide were refluxed in methanol. Colorless blockshaped crystals were formed by slow evaporation of the solution in air.

Refinement
H2 was located in a difference Fourier map and refined isotropically, with the N-H distance restrained to 0.90 (1) Å. The other H atoms were placed in idealized positions and constrained to ride on their parent atoms, with C-H distances of 0.93 and 0.96 Å, and with U iso (H) = kU eq (C), where k = 1.2 for Csp 2 and 1.5 for methyl C. Fig. 1. The molecular structure of the title compound with ellipsoids drawn at the 30% probability level. Hydrogen atoms are shown as spheres of arbitrary radius.

Special details
Geometry. All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes.
Refinement. Refinement of F 2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F 2 , conventional R-factors R are based on F, with F set to zero for negative F 2 . The threshold expression of F 2 > 2sigma(F 2 ) is used only for calculat-supplementary materials sup-3 ing R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F 2 are statistically about twice as large as those based on F, and R-factors based on ALL data will be even larger.