N-Cyclohexyl-N-ethyl-4-methylbenzenesulfonamide

The title compound, C15H23NO2S, contains cyclohexyl and ethyl substituents on the sulfonamide N atom and the cyclohexyl ring adopts a classic chair conformation. The dihedral angle between the benzene ring plane and the mean plane through the six atoms of the cyclohexyl ring is 59.92 (6)°. In the crystal structure, C—H⋯O hydrogen bonds link molecules into sheets extending in the bc plane.

The title compound, C 15 H 23 NO 2 S, contains cyclohexyl and ethyl substituents on the sulfonamide N atom and the cyclohexyl ring adopts a classic chair conformation. The dihedral angle between the benzene ring plane and the mean plane through the six atoms of the cyclohexyl ring is 59.92 (6) . In the crystal structure, C-HÁ Á ÁO hydrogen bonds link molecules into sheets extending in the bc plane.

Experimental
A mixture of N-cyclohexyl-4-methyl benzene sulfonamide (1.089 g, 4.3 mmol), sodium hydride (0.21 g, 8.6 mmol) and N, N-dimethylformamide (10 ml) was stirred at room temperature for half an hour followed by addition of ethyl iodode (1.32 g, 8.6 mmol). Stirring was continued further for a period of three hours and the contents were poured over crushed ice.
Precipitated product was isolated, washed and crystallized from a methanol solution.
The 1 0 0 reflection was identified as being obscured by the beamstop and was omitted. Fig. 1. The structure of (I) with displacement ellipsoids for the non-hydrogen atoms drawn at the 50% probability level.

Special details
Geometry. All s.u.'s (except the s.u. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell s.u.'s are taken into account individually in the estimation of s.u.'s in distances, angles and torsion angles; correlations between s.u.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell s.u.'s is used for estimating s.u.'s involving l.s. planes.
Refinement. Refinement of F 2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F 2 , conventional R-factors R are based on F, with F set to zero for negative F 2 . The threshold expression of F 2 > 2σ(F 2 ) is used only for calculating Rfactors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F 2 are statistically about twice as large as those based on F, and R-factors based on ALL data will be even larger.