Vanadium(V) oxide arsenate(V), VOAsO4

Ezzine Yahmed, S.; Zid, M.F.; Driss, A.

doi:10.1107/S1600536811004053

Volume 67
Part 3
Page i21
March 2011

Received 10 January 2011
Accepted 1 February 2011
Online 5 February 2011

Key indicators
Single-crystal X-ray study
T = 298 K
Mean (V-O) = 0.002 Å
R = 0.018
wR = 0.057
Data-to-parameter ratio = 11.1
Details

Vanadium(V) oxide arsenate(V), VOAsO₄

Safa Ezzine Yahmed,^a Mohamed Faouzi Zid ^a ^* and Ahmed Driss ^a

^aLaboratoire de Matériaux et Cristallochimie, Faculté des Sciences, Université de Tunis-ElManar, 2092 El-Manar, Tunis, Tunisia
Correspondence e-mail: faouzi.zid@fst.rnu.tn

The vanadyl arsenate, VOAsO₄, has been isolated by a solid-state reaction. The structure consists of distorted VO₆ octahedra and AsO₄ tetrahedra sharing corners to build up VAsO₇ layers parallel to ac linked by edge-sharing of VO₆ octahedra, forming a three-dimensional framework.

Related literature

For the preparation, see: Ezzine et al. (2009). For structural relationships, see: Leclaire et al. (2002); Lii et al. (1990); Haddad et al. (1992); Haddad & Jouini (1994); Borel et al. (1997). For properties of related compounds, see: Aranda et al. (1992); Daidouh et al. (1997); Nguyen & Sleight (1996). For bond-valence data, see: Brown & Altermatt (1985). For related structures with formula MOXO₄ (M = V, Nb, Mo, Sb; X = P, S), see: Amos et al. (1998); Boghosian et al. (1995); Kierkegaard & Longo (1970); Piffard et al. (1986); Tachez et al. (1981).

Experimental

Crystal data

VOAsO₄
M_r = 205.86
Monoclinic, P 2₁ /n
a = 6.3338 (7) Å
b = 8.2826 (8) Å
c = 6.3599 (7) Å
= 90.19 (1)°
V = 333.64 (6) Å³
Z = 4
Mo K radiation
= 12.69 mm^-1
T = 298 K
0.21 × 0.11 × 0.10 mm

Data collection

Enraf-Nonius CAD-4 diffractometer
Absorption correction: scan (North et al., 1968) T_min = 0.201, T_max = 0.276
1646 measured reflections
724 independent reflections
672 reflections with I > 2(I)
R_int = 0.022
2 standard reflections every 120 min intensity decay: 1.2%

Refinement

R[F² > 2(F²)] = 0.018
wR(F²) = 0.057
S = 1.16
724 reflections
65 parameters
_max = 0.63 e Å^-3
_min = -0.72 e Å^-3

Data collection: CAD-4 EXPRESS (Duisenberg, 1992; Macícek & Yordanov, 1992); cell refinement: CAD-4 EXPRESS; data reduction: XCAD4 (Harms & Wocadlo, 1995); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: DIAMOND (Brandenburg, 1998); software used to prepare material for publication: WinGX (Farrugia, 1999).

Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: RU2001 ).

References

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inorganic compounds