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Volume 68 
Part 4 
Page o1141  
April 2012  

Received 14 September 2011
Accepted 9 March 2012
Online 24 March 2012

Key indicators
Single-crystal X-ray study
T = 293 K
Mean [sigma](C-C) = 0.002 Å
R = 0.039
wR = 0.116
Data-to-parameter ratio = 14.0
Details
Open access

2-[N-(4-{4-[(2-Hydroxy-5-methoxybenzylidene)amino]benzyl}phenyl)carboximidoyl]-4-methoxyphenol

aLaboratoire d'Electrochimie, d'Ingénierie Moléculaire et de Catalyse Redox (LEIMCR), Faculté des Sciences de l'Ingénieur, Université Farhat Abbas, Sétif 19000, Algeria,bLaboratoire SONAS, E.A. 921, Faculté de Pharmacie, 16 Boulevard Daviers, 49045 Angers Cedex 01, France, and cMOLTECH ANJOU UMR CNRS 6200, 2, bd Lavoisier, 49045 Angers Cedex, France
Correspondence e-mail: alourari@yahoo.fr

In the title Schiff base, C29H26N2O4, the complete molecule is generated by a crystallographic twofold axis and is V-shaped. The planes of the benzene rings of the central diphenylmethane unit make a dihedral angle of 78.11 (4)° while adjacent benzene and 5-methoxysalicylidene rings are twisted with respect to each other by a dihedral angle of 11.84 (8)°. The Schiff base is in the enol-imino form and an intramolecular O-H...N hydrogen bond is observed.

Related literature

For related bis-bidentate Schiff base ligand structures, see: Birkedal & Pattison (2006[Birkedal, H. & Pattison, P. (2006). Acta Cryst. C62, o139-o141.]); Shahverdizadeh & Tiekink (2011[Shahverdizadeh, G. H. & Tiekink, E. R. T. (2011). Acta Cryst. E67, o798.]). For Schiff base ligands, see: Chu & Huang (2007[Chu, Z. & Huang, W. (2007). J. Mol. Struct. 837, 15-22.]); Yoshida & Ichikawa, (1997[Yoshida, N. & Ichikawa, K. (1997). J. Chem. Soc. Chem. Commun. pp. 1091-1092.]); Kruger et al. (2001[Kruger, P. E., Martin, N. & Niuwenhuyzen, M. (2001). J. Chem. Soc. Dalton Trans. pp. 1966-1970.]); Moutet & Ourari (1997[Moutet, J. C. & Ourari, A. (1997). Electrochim. Acta, 42, 2525-2531.]). For applications of bis-bidentate Schiff base ligands, see: Lin et al. (2008[Lin, C. H., Chang, S. L., Hsieh, C. W. & Lee, H. H. (2008). Polymer, 49, 1220-1229.]); Sadeghi et al. (2003[Sadeghi, S., Eslahi, M., Naseri, M. A., Naeimi, H., Sharghi, H. & Shameli, A. (2003). Electroanalysis, 15, 1327-1333.]).

[Scheme 1]

Experimental

Crystal data
  • C29H26N2O4

  • Mr = 466.52

  • Monoclinic, C 2/c

  • a = 41.307 (4) Å

  • b = 4.5993 (3) Å

  • c = 12.2229 (13) Å

  • [beta] = 93.653 (12)°

  • V = 2317.4 (4) Å3

  • Z = 4

  • Mo K[alpha] radiation

  • [mu] = 0.09 mm-1

  • T = 293 K

  • 0.69 × 0.38 × 0.06 mm

Data collection
  • Stoe IPDS diffractometer

  • Absorption correction: gaussian (ABSGAUSS in PLATON; Spek, 2009[Spek, A. L. (2009). Acta Cryst. D65, 148-155.]) Tmin = 0.953, Tmax = 0.993

  • 10694 measured reflections

  • 2244 independent reflections

  • 1662 reflections with I > 2[sigma](I)

  • Rint = 0.037

Refinement
  • R[F2 > 2[sigma](F2)] = 0.039

  • wR(F2) = 0.116

  • S = 1.06

  • 2244 reflections

  • 160 parameters

  • H-atom parameters constrained

  • [Delta][rho]max = 0.17 e Å-3

  • [Delta][rho]min = -0.15 e Å-3

Table 1
Hydrogen-bond geometry (Å, °)

D-H...A D-H H...A D...A D-H...A
O1-H1...N1 0.89 1.81 2.6177 (15) 151

Data collection: EXPOSE (Stoe & Cie, 1995[Stoe & Cie (1995). EXPOSE and X-RED. Stoe & Cie, Darmstadt, Germany.]); cell refinement: X-RED (Stoe & Cie, 1995[Stoe & Cie (1995). EXPOSE and X-RED. Stoe & Cie, Darmstadt, Germany.]); data reduction: X-RED; program(s) used to solve structure: SIR92 (Altomare et al., 1993[Altomare, A., Cascarano, G., Giacovazzo, C. & Guagliardi, A. (1993). J. Appl. Cryst. 26, 343-350.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997[Farrugia, L. J. (1997). J. Appl. Cryst. 30, 565.]); software used to prepare material for publication: publCIF (Westrip, 2010[Westrip, S. P. (2010). J. Appl. Cryst. 43, 920-925.]).


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: QK2024 ).


Acknowledgements

The authors are very grateful to Professor Jean-Claude Daran at the Laboratoire de Chimie de Coordination, UPR-CNRS 8241 (Toulouse) for his valuable contribution and insightful discussions.

References

Altomare, A., Cascarano, G., Giacovazzo, C. & Guagliardi, A. (1993). J. Appl. Cryst. 26, 343-350.  [CrossRef] [ISI] [details]
Birkedal, H. & Pattison, P. (2006). Acta Cryst. C62, o139-o141.  [CSD] [CrossRef] [details]
Chu, Z. & Huang, W. (2007). J. Mol. Struct. 837, 15-22.  [ISI] [CSD] [CrossRef] [ChemPort]
Farrugia, L. J. (1997). J. Appl. Cryst. 30, 565.  [CrossRef] [details]
Kruger, P. E., Martin, N. & Niuwenhuyzen, M. (2001). J. Chem. Soc. Dalton Trans. pp. 1966-1970.  [CSD] [CrossRef]
Lin, C. H., Chang, S. L., Hsieh, C. W. & Lee, H. H. (2008). Polymer, 49, 1220-1229.  [CrossRef] [ChemPort]
Moutet, J. C. & Ourari, A. (1997). Electrochim. Acta, 42, 2525-2531.  [CrossRef] [ChemPort] [ISI]
Sadeghi, S., Eslahi, M., Naseri, M. A., Naeimi, H., Sharghi, H. & Shameli, A. (2003). Electroanalysis, 15, 1327-1333.  [CrossRef] [ChemPort]
Shahverdizadeh, G. H. & Tiekink, E. R. T. (2011). Acta Cryst. E67, o798.  [CSD] [CrossRef] [details]
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [details]
Spek, A. L. (2009). Acta Cryst. D65, 148-155.  [ISI] [CrossRef] [details]
Stoe & Cie (1995). EXPOSE and X-RED. Stoe & Cie, Darmstadt, Germany.
Westrip, S. P. (2010). J. Appl. Cryst. 43, 920-925.  [ISI] [CrossRef] [ChemPort] [details]
Yoshida, N. & Ichikawa, K. (1997). J. Chem. Soc. Chem. Commun. pp. 1091-1092.


Acta Cryst (2012). E68, o1141  [ doi:10.1107/S1600536812010550 ]

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