Ethyl 2-[4-(4-chlorobenzoyl)phenoxy]-2-methylpropanoate

In the title compound, C19H19ClO4, the dihedral angle between the mean planes of the benzene rings is 126.8 (1)°. Weak C—H⋯O interactions are observed.

In the title compound, C 19 H 19 ClO 4 , the dihedral angle between the mean planes of the benzene rings is 126.8 (1) . Weak C-HÁ Á ÁO interactions are observed.
In the title compound, (I), the dihedral angle between the mean planes of the benzene and phenyl rings is 126.8 (1)°.
Crystal packing is influenced by weak C-H···O intermolecular interactions. Bond lengths are in normal ranges (Allen et al. 1987).
Experimental 2-(4-(4-chlorobenzoyl)phenoxy)-2-methylpropanoic acid (6.28 mmol, 2.00 g) was dissolved in 35% hydrochloric acid ethanol solution (15 ml), the solution was heated to 338.15 K under N 2 atmosphere for 3 h. The reaction mexture was cooled to room temperature and the solvent was distilled to get the crude compound. The crude compond was dissolved in dichloromethane (15 ml), washed with water (10 ml) three times, dried, and concentrated to get the title compound (1.95 g). pure: white solid (Bandgar et al. 2011). Crystals of the title compound suitable for X-ray diffraction were obtained by slow evaporation of an ethanol solution.

Refinement
H atoms were positioned geometrically with C-H = 0.93, 0.98 and 0.97 Å for aromatic, methine and methylene H atoms, respectively, and constrained to ride on their parent atoms, with U iso (H) = 1.2 (or 1.5 for methyl groups) times U eq (C). 1692 Friedel pairs were measured.

Ethyl 2-[4-(4-chlorobenzoyl)phenoxy]-2-methylpropanoate
Friedel pairs Flack parameter: 0.04 (17) Special details Geometry. All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes. Refinement. Refinement of F 2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F 2 , conventional R-factors R are based on F, with F set to zero for negative F 2 . The threshold expression of F 2 > 2sigma(F 2 ) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F 2 are statistically about twice as large as those based on F, and R-factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å 2 )
x y z U iso */U eq