Acta Cryst. (2012). E68, m1534
[ doi:10.1107/S1600536812047368 ]

Bis[O-propyl (4-ethoxyphenyl)dithiophosphonato-²S,S']nickel(II)

S. Sewpersad, B. Omondi and W. E. Van Zyl

Key indicators

• Single-crystal X-ray study
• T = 173 K
• Mean (C-C) = 0.002 Å
• R factor = 0.019
• wR factor = 0.053
• Data-to-parameter ratio = 22.5

checkCIF/PLATON results

No syntax errors found




Alert level G
PLAT005_ALERT_5_G No _iucr_refine_instructions_details  in the CIF          ?
PLAT232_ALERT_2_G Hirshfeld Test Diff (M-X)  Ni1    --  S2      ..       12.5 su   
PLAT232_ALERT_2_G Hirshfeld Test Diff (M-X)  Ni1    --  S4      ..        9.0 su   
PLAT912_ALERT_4_G Missing # of FCF Reflections Above STh/L=  0.600         19      

   0 ALERT level A = Most likely a serious problem - resolve or explain
   0 ALERT level B = A potentially serious problem, consider carefully
   0 ALERT level C = Check. Ensure it is not caused by an omission or oversight
   4 ALERT level G = General information/check it is not something unexpected

   0 ALERT type 1 CIF construction/syntax error, inconsistent or missing data
   2 ALERT type 2 Indicator that the structure model may be wrong or deficient
   0 ALERT type 3 Indicator that the structure quality may be low
   1 ALERT type 4 Improvement, methodology, query or suggestion
   1 ALERT type 5 Informative message, check

Copyright © International Union of Crystallography
IUCr Webmaster