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Volume 70 
Part 1 
Page m20  
January 2014  

Received 26 November 2013
Accepted 11 December 2013
Online 14 December 2013

Key indicators
Single-crystal X-ray study
T = 298 K
Mean [sigma](C-C) = 0.013 Å
R = 0.036
wR = 0.100
Data-to-parameter ratio = 16.3
Details
Open access

Iodido­bis­(morpholine-4-carbodi­thio­ato-[kappa]2S,S')(1,10-phenanthroline-[kappa]2N,N')bis­muth(III)

aDepartment of Chemistry and Chemical Engineering, Lvliang University, Lishi Shanxi 033000, People's Republic of China, and bCollege of Chemistry and Chemical Engineering, Liaocheng University, Shandong 252059, People's Republic of China
Correspondence e-mail: lifeng1982@163.com

The title compound, [Bi(C4H8NOS2)2I(C12H8N2)], is monomeric, with the BiIII atom chelated by the two S atoms of two morpholine-4-carbodi­thio­ate ligands and the two N atoms of a 1,10-phenanthroline ligand. An iodide ligand completes the coordination sphere, with the seven-coordinate BiIII atom adopting a highly distorted monocapped octa­hedral geometry.

Related literature

For di­thio­carbamates as ligands to transition metals, see: Xu et al. (2001[Xu, L. Z., Zhao, P. S. & Zhang, S. S. (2001). Chin. J. Chem. 19, 436-440.]); Bardaji et al. (1994[Bardaji, M., Connelly, N. G., Gimeno, M. C., Jimenez, J., Jones, P. G., Laguna, A. & Laguna, M. (1994). J. Chem. Soc. Dalton Trans. pp. 1163-1168.]). For bis­muth(III)-di­thio­carbamate complexes, see: Yin et al. (2003[Yin, H. D., Wang, C. H. & Xing, Q. J. (2003). Chin. J. Inorg. Chem. 19, 955-958.]). For related Bi/N structures, see: Baraanyi et al. (1977[Baraanyi, A. D., Cook, J. & Onyszchuk, M. (1977). Inorg. Nucl. Chem. Lett. 13, 385-394.]).

[Scheme 1]

Experimental

Crystal data
  • [Bi(C4H8NOS2)2I(C12H8N2)]

  • Mr = 836.62

  • Monoclinic, P 21 /c

  • a = 14.782 (4) Å

  • b = 10.883 (3) Å

  • c = 18.030 (4) Å

  • [beta] = 100.035 (4)°

  • V = 2856.2 (12) Å3

  • Z = 4

  • Mo K[alpha] radiation

  • [mu] = 7.57 mm-1

  • T = 298 K

  • 0.52 × 0.42 × 0.13 mm

Data collection
  • Siemens SMART CCD area-detector diffractometer

  • Absorption correction: multi-scan (SADABS; Sheldrick, 1996[Sheldrick, G. M. (1996). SADABS. University of Göttingen, Germany.]) Tmin = 0.111, Tmax = 0.440

  • 14581 measured reflections

  • 5013 independent reflections

  • 3883 reflections with I > 2[sigma](I)

  • Rint = 0.051

Refinement
  • R[F2 > 2[sigma](F2)] = 0.036

  • wR(F2) = 0.100

  • S = 1.00

  • 5013 reflections

  • 307 parameters

  • 162 restraints

  • H-atom parameters constrained

  • [Delta][rho]max = 2.14 e Å-3

  • [Delta][rho]min = -1.18 e Å-3

Table 1
Selected bond lengths (Å)

Bi1-S3 2.683 (2)
Bi1-S1 2.7032 (18)
Bi1-N3 2.738 (6)
Bi1-S2 2.775 (2)
Bi1-N4 2.831 (6)
Bi1-S4 2.962 (2)
Bi1-I1 3.1043 (9)

Data collection: SMART (Siemens, 1996[Siemens (1996). SMART and SAINT. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]); cell refinement: SAINT (Siemens, 1996[Siemens (1996). SMART and SAINT. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.]); data reduction: SAINT; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: SHELXTL (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); software used to prepare material for publication: SHELXTL.


Supplementary data and figures for this paper are available from the IUCr electronic archives (Reference: SJ5375 ).


Acknowledgements

We acknowledge financial support from the Luliang University Campus Youth Foundation.

References

Baraanyi, A. D., Cook, J. & Onyszchuk, M. (1977). Inorg. Nucl. Chem. Lett. 13, 385-394.  [CrossRef]
Bardaji, M., Connelly, N. G., Gimeno, M. C., Jimenez, J., Jones, P. G., Laguna, A. & Laguna, M. (1994). J. Chem. Soc. Dalton Trans. pp. 1163-1168.  [CSD] [CrossRef]
Sheldrick, G. M. (1996). SADABS. University of Göttingen, Germany.
Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.  [CrossRef] [ChemPort] [IUCr Journals]
Siemens (1996). SMART and SAINT. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
Xu, L. Z., Zhao, P. S. & Zhang, S. S. (2001). Chin. J. Chem. 19, 436-440.  [CrossRef] [ChemPort]
Yin, H. D., Wang, C. H. & Xing, Q. J. (2003). Chin. J. Inorg. Chem. 19, 955-958.  [ChemPort]


Acta Cryst (2014). E70, m20  [ doi:10.1107/S1600536813033515 ]

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