Journal of Applied Crystallography
Volume 1, Part 1 (April 1968)
research papers
J. Appl. Cryst. (1968). 1, 1-19 [doi:10.1107/S0021889868004930]
A test object and criteria for high resolution electron microscopy
R. D. Heidenreich, W. M. Hess and L. L. Ban
J. Appl. Cryst. (1968). 1, 19-23 [doi:10.1107/S0021889868004942]
Direct method for unfolding convolution products - its application to X-ray scattering intensities
S. Ergun
J. Appl. Cryst. (1968). 1, 23-30 [doi:10.1107/S0021889868004954]
Appareillage pour études radiocristallographiques sous pression et à température variable
R. Fourme
J. Appl. Cryst. (1968). 1, 30-35 [doi:10.1107/S0021889868004966]
The metastable system Ga-Al and the atomic volume of twelvefold coordinated Ga
B. C. Giessen, U. Wolff and N. J. Grant
J. Appl. Cryst. (1968). 1, 35-48 [doi:10.1107/S0021889868004978]
Relationships between interlayer spacing, stacking order and crystallinity in carbon materials
B. P. Richards
J. Appl. Cryst. (1968). 1, 48-59 [doi:10.1107/S002188986800498X]
The variance and other measures of line broadening in powder diffractometry. I. Practical considerations
J. I. Langford
notes and news
J. Appl. Cryst. (1968). 1, 59 [doi:10.1107/S0021889868004991]
Notes and News
book reviews
J. Appl. Cryst. (1968). 1, 60 [doi:10.1107/S0021889868005005]
Théorie Mathématique des Dislocations by M. Zorawski
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