Journal of Applied Crystallography

Volume 1, Part 1 (April 1968)



research papers



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J. Appl. Cryst. (1968). 1, 1-19    [doi:10.1107/S0021889868004930]

A test object and criteria for high resolution electron microscopy

R. D. Heidenreich, W. M. Hess and L. L. Ban



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J. Appl. Cryst. (1968). 1, 19-23    [doi:10.1107/S0021889868004942]

Direct method for unfolding convolution products - its application to X-ray scattering intensities

S. Ergun



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J. Appl. Cryst. (1968). 1, 23-30    [doi:10.1107/S0021889868004954]

Appareillage pour études radiocristallographiques sous pression et à température variable

R. Fourme



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J. Appl. Cryst. (1968). 1, 30-35    [doi:10.1107/S0021889868004966]

The metastable system Ga-Al and the atomic volume of twelvefold coordinated Ga

B. C. Giessen, U. Wolff and N. J. Grant



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J. Appl. Cryst. (1968). 1, 35-48    [doi:10.1107/S0021889868004978]

Relationships between interlayer spacing, stacking order and crystallinity in carbon materials

B. P. Richards



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J. Appl. Cryst. (1968). 1, 48-59    [doi:10.1107/S002188986800498X]

The variance and other measures of line broadening in powder diffractometry. I. Practical considerations

J. I. Langford


notes and news



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J. Appl. Cryst. (1968). 1, 59    [doi:10.1107/S0021889868004991]

Notes and News


book reviews



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J. Appl. Cryst. (1968). 1, 60    [doi:10.1107/S0021889868005005]

Théorie Mathématique des Dislocations by M. Zorawski


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