Journal of Applied Crystallography

Volume 1, Part 2 (June 1968)

• research papers
• short communications
• forthcoming meetings and short courses

research papers

J. Appl. Cryst. (1968). 1, 61-67    [doi:10.1107/S0021889868005017]

Long range order in Ag₃Mg

A. Gangulee and S. C. Moss

J. Appl. Cryst. (1968). 1, 68-70    [doi:10.1107/S0021889868005029]

The construction of stereographic projections by computer

G. K. Stokes, S. R. Keown and D. J. Dyson

J. Appl. Cryst. (1968). 1, 70-82    [doi:10.1107/S0021889868005030]

The epitaxy of silicon on quartz

A. S. Brown, B. A. Joyce, J. H. Neave and D. J. Stirland

J. Appl. Cryst. (1968). 1, 82-84    [doi:10.1107/S0021889868005042]

Determination of orientation distributions in fibres and sheets

S. Seitsonen

J. Appl. Cryst. (1968). 1, 84-90    [doi:10.1107/S0021889868005054]

A point-focusing camera for single-crystal diffraction

S. C. Harrison

J. Appl. Cryst. (1968). 1, 90-101    [doi:10.1107/S0021889868005066]

The separation of line broadening effects by means of line-width relations

W. Ruland

J. Appl. Cryst. (1968). 1, 101-107    [doi:10.1107/S0021889868005078]

Absorption corrections in complex cases. Application to single crystal diffraction studies at high pressure

A. Santoro, C. E. Weir, S. Block and G. J. Piermarini

J. Appl. Cryst. (1968). 1, 108-113    [doi:10.1107/S002188986800508X]

A simplified criterion for the reliability of a powder pattern indexing

P. M. de Wolff

J. Appl. Cryst. (1968). 1, 113-116    [doi:10.1107/S0021889868005091]

Etude cristallographique de quelques fluorures complexes de terres rares de formule A₂NaTF₆

S. Aléonard and C. Pouzet

J. Appl. Cryst. (1968). 1, 117-118    [doi:10.1107/S0021889868005108]

Diffusion anomale des rayons X par des semiconducteurs de structure type blende

C. Schiller et B. Jarrousse

J. Appl. Cryst. (1968). 1, 119-121    [doi:10.1107/S002188986800511X]

Grading of powder specimens in respect of dispersion and compactness by means of the diffracted intensity

I. Asztalos and P. Gadó

J. Appl. Cryst. (1968). 1, 121-122    [doi:10.1107/S0021889868005121]

Determination of polarization factor of crystal monochromators

P. Suortti and T. Paakkari

J. Appl. Cryst. (1968). 1, 123-124    [doi:10.1107/S0021889868005133]

Lattice constants for vanadium in gold

B. Morosin

J. Appl. Cryst. (1968). 1, 124-126    [doi:10.1107/S0021889868005145]

Röntgenbeugungs- und Neutronenbeugungsuntersuchungen an Ferriten der reihe Mn_xZn_1-xFe₂O₄

U. König und G. Chol

short communications

J. Appl. Cryst. (1968). 1, 126-128    [doi:10.1107/S0021889868005157]

Single-crystal alignment with a polaroid adapter for the Weissenberg goniometer

R. Rudman

J. Appl. Cryst. (1968). 1, 128-130    [doi:10.1107/S0021889868005169]

An automatic balanced filter device for X-ray diffraction experiments

R. W. Hendricks, J. S. Arrington Jnr and W. J. Mason

forthcoming meetings and short courses

J. Appl. Cryst. (1968). 1, 130    [doi:10.1107/S0021889868005170]

Meetings

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