Journal of Applied Crystallography

Volume 1, Part 2 (June 1968)



research papers



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J. Appl. Cryst. (1968). 1, 61-67    [doi:10.1107/S0021889868005017]

Long range order in Ag3Mg

A. Gangulee and S. C. Moss



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J. Appl. Cryst. (1968). 1, 68-70    [doi:10.1107/S0021889868005029]

The construction of stereographic projections by computer

G. K. Stokes, S. R. Keown and D. J. Dyson



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J. Appl. Cryst. (1968). 1, 70-82    [doi:10.1107/S0021889868005030]

The epitaxy of silicon on quartz

A. S. Brown, B. A. Joyce, J. H. Neave and D. J. Stirland



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J. Appl. Cryst. (1968). 1, 82-84    [doi:10.1107/S0021889868005042]

Determination of orientation distributions in fibres and sheets

S. Seitsonen



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J. Appl. Cryst. (1968). 1, 84-90    [doi:10.1107/S0021889868005054]

A point-focusing camera for single-crystal diffraction

S. C. Harrison



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J. Appl. Cryst. (1968). 1, 90-101    [doi:10.1107/S0021889868005066]

The separation of line broadening effects by means of line-width relations

W. Ruland



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J. Appl. Cryst. (1968). 1, 101-107    [doi:10.1107/S0021889868005078]

Absorption corrections in complex cases. Application to single crystal diffraction studies at high pressure

A. Santoro, C. E. Weir, S. Block and G. J. Piermarini



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J. Appl. Cryst. (1968). 1, 108-113    [doi:10.1107/S002188986800508X]

A simplified criterion for the reliability of a powder pattern indexing

P. M. de Wolff



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J. Appl. Cryst. (1968). 1, 113-116    [doi:10.1107/S0021889868005091]

Etude cristallographique de quelques fluorures complexes de terres rares de formule A2NaTF6

S. Aléonard and C. Pouzet



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J. Appl. Cryst. (1968). 1, 117-118    [doi:10.1107/S0021889868005108]

Diffusion anomale des rayons X par des semiconducteurs de structure type blende

C. Schiller et B. Jarrousse



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J. Appl. Cryst. (1968). 1, 119-121    [doi:10.1107/S002188986800511X]

Grading of powder specimens in respect of dispersion and compactness by means of the diffracted intensity

I. Asztalos and P. Gadó



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J. Appl. Cryst. (1968). 1, 121-122    [doi:10.1107/S0021889868005121]

Determination of polarization factor of crystal monochromators

P. Suortti and T. Paakkari



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J. Appl. Cryst. (1968). 1, 123-124    [doi:10.1107/S0021889868005133]

Lattice constants for vanadium in gold

B. Morosin



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J. Appl. Cryst. (1968). 1, 124-126    [doi:10.1107/S0021889868005145]

Röntgenbeugungs- und Neutronenbeugungsuntersuchungen an Ferriten der reihe MnxZn1-xFe2O4

U. König und G. Chol


short communications



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J. Appl. Cryst. (1968). 1, 126-128    [doi:10.1107/S0021889868005157]

Single-crystal alignment with a polaroid adapter for the Weissenberg goniometer

R. Rudman



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J. Appl. Cryst. (1968). 1, 128-130    [doi:10.1107/S0021889868005169]

An automatic balanced filter device for X-ray diffraction experiments

R. W. Hendricks, J. S. Arrington Jnr and W. J. Mason


forthcoming meetings and short courses



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J. Appl. Cryst. (1968). 1, 130    [doi:10.1107/S0021889868005170]

Meetings

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