Journal of Applied Crystallography

Volume 1, Part 3 (September 1968)



research papers



pdf version buy article online

J. Appl. Cryst. (1968). 1, 131-138    [doi:10.1107/S0021889868005182]

The variance and other measures of line broadening in powder diffractometry. II. Determination of particle size

J. I. Langford



pdf version buy article online

J. Appl. Cryst. (1968). 1, 139-145    [doi:10.1107/S0021889868005194]

Strain inhomogeneities in lightly compressed tungsten crystals

B. A. Newman and S. Weissmann



pdf version buy article online

J. Appl. Cryst. (1968). 1, 145-153    [doi:10.1107/S0021889868005200]

The analysis of epitaxic growth layers of silicon carbide by X-ray diffraction topography

B. J. Isherwood and C. A. Wallace



pdf version buy article online

J. Appl. Cryst. (1968). 1, 153-165    [doi:10.1107/S0021889868005212]

Interprétation de la diffusion centrale des rayons X par les systèmes poreux. I

J. Méring et D. Tchoubar



pdf version buy article online

J. Appl. Cryst. (1968). 1, 165-171    [doi:10.1107/S0021889868005224]

X-ray diffraction contrast of inversion twin boundaries in BeO crystals

J.-I. Chikawa and S. B. Austerman



pdf version buy article online

J. Appl. Cryst. (1968). 1, 172-175    [doi:10.1107/S0021889868005236]

Etching of synthetic barite (BaSO4) single crystals

A. R. Patel and J. Koshy



pdf version buy article online

J. Appl. Cryst. (1968). 1, 176-178    [doi:10.1107/S0021889868005248]

A small set of reference crystals for double-crystal topography

R. D. Deslattes and B. Paretzkin



pdf version buy article online

J. Appl. Cryst. (1968). 1, 178-181    [doi:10.1107/S002188986800525X]

Une méthode générale pour l'indexation des diagrammes de poudres

D. Taupin



pdf version buy article online

J. Appl. Cryst. (1968). 1, 181-184    [doi:10.1107/S0021889868005261]

Mise en évidence de la dispersion anormale par mesure de l'indice d'un prisme à l'aide de la double diffraction des rayons X

C. Malgrange, E. Velu et A. Authier



pdf version buy article online

J. Appl. Cryst. (1968). 1, 184-186    [doi:10.1107/S0021889868005273]

Auswirkung elastischer Anisotropie auf die Kontrastfelder bei röntgentopographischer Abbildung von Oxydfilmkanten auf Silizium

U. Wattenberg



pdf version buy article online

J. Appl. Cryst. (1968). 1, 187-189    [doi:10.1107/S0021889868005285]

The variation of the lattice parameter of the solid solutions of lithium oxide in nickel oxide

C. J. Toussaint and G. Vos



pdf version buy article online

J. Appl. Cryst. (1968). 1, 190-193    [doi:10.1107/S0021889868005297]

Suppression de l'effet de texture sur la mesure de l'intensité diffractée. Dosage de l'austenite residuelle dans les aciers laminés

J. Manenc et A. Carel


short communications



pdf version buy article online

J. Appl. Cryst. (1968). 1, 194    [doi:10.1107/S0021889868005303]

Crystal data of La5Ge3C1.5

I. Mayer and I. Shidlovsky



pdf version buy article online

J. Appl. Cryst. (1968). 1, 194-196    [doi:10.1107/S0021889868005315]

On variance as a measure of line broadening in diffractometry: effect of a distribution of sizes on the apparent crystallite size

A. J. C. Wilson


notes and news



pdf version Open access

J. Appl. Cryst. (1968). 1, 196-197    [doi:10.1107/S0021889868005327]

Notes and News


books received



pdf version Open access

J. Appl. Cryst. (1968). 1, 198    [doi:10.1107/S0021889868005339]

Stereology. Proceedings of the Second International Congress for Stereology, Chicago, April 8-13, 1967 edited by H. Elias



pdf version Open access

J. Appl. Cryst. (1968). 1, 198    [doi:10.1107/S0021889868005340]

Static electrification. Proceedings of the conference organized by the Institute of Physics and the Physical Society Static Electrification Group


Copyright © International Union of Crystallography
IUCr Webmaster