Journal of Applied Crystallography

Volume 1, Part 3 (September 1968)

research papers
short communications
notes and news
books received

research papers

J. Appl. Cryst. (1968). 1, 131-138 [doi:10.1107/S0021889868005182]

The variance and other measures of line broadening in powder diffractometry. II. Determination of particle size

J. I. Langford

J. Appl. Cryst. (1968). 1, 139-145 [doi:10.1107/S0021889868005194]

Strain inhomogeneities in lightly compressed tungsten crystals

B. A. Newman and S. Weissmann

J. Appl. Cryst. (1968). 1, 145-153 [doi:10.1107/S0021889868005200]

The analysis of epitaxic growth layers of silicon carbide by X-ray diffraction topography

B. J. Isherwood and C. A. Wallace

J. Appl. Cryst. (1968). 1, 153-165 [doi:10.1107/S0021889868005212]

Interprétation de la diffusion centrale des rayons X par les systèmes poreux. I

J. Méring et D. Tchoubar

J. Appl. Cryst. (1968). 1, 165-171 [doi:10.1107/S0021889868005224]

X-ray diffraction contrast of inversion twin boundaries in BeO crystals

J.-I. Chikawa and S. B. Austerman

J. Appl. Cryst. (1968). 1, 172-175 [doi:10.1107/S0021889868005236]

Etching of synthetic barite (BaSO₄) single crystals

A. R. Patel and J. Koshy

J. Appl. Cryst. (1968). 1, 176-178 [doi:10.1107/S0021889868005248]

A small set of reference crystals for double-crystal topography

R. D. Deslattes and B. Paretzkin

J. Appl. Cryst. (1968). 1, 178-181 [doi:10.1107/S002188986800525X]

Une méthode générale pour l'indexation des diagrammes de poudres

D. Taupin

J. Appl. Cryst. (1968). 1, 181-184 [doi:10.1107/S0021889868005261]

Mise en évidence de la dispersion anormale par mesure de l'indice d'un prisme à l'aide de la double diffraction des rayons X

C. Malgrange, E. Velu et A. Authier

J. Appl. Cryst. (1968). 1, 184-186 [doi:10.1107/S0021889868005273]

Auswirkung elastischer Anisotropie auf die Kontrastfelder bei röntgentopographischer Abbildung von Oxydfilmkanten auf Silizium

U. Wattenberg

J. Appl. Cryst. (1968). 1, 187-189 [doi:10.1107/S0021889868005285]

The variation of the lattice parameter of the solid solutions of lithium oxide in nickel oxide

C. J. Toussaint and G. Vos

J. Appl. Cryst. (1968). 1, 190-193 [doi:10.1107/S0021889868005297]

Suppression de l'effet de texture sur la mesure de l'intensité diffractée. Dosage de l'austenite residuelle dans les aciers laminés

J. Manenc et A. Carel

short communications

J. Appl. Cryst. (1968). 1, 194 [doi:10.1107/S0021889868005303]

Crystal data of La₅Ge₃C_1.5

I. Mayer and I. Shidlovsky

J. Appl. Cryst. (1968). 1, 194-196 [doi:10.1107/S0021889868005315]

On variance as a measure of line broadening in diffractometry: effect of a distribution of sizes on the apparent crystallite size

A. J. C. Wilson

notes and news

J. Appl. Cryst. (1968). 1, 196-197 [doi:10.1107/S0021889868005327]

Notes and News

books received

J. Appl. Cryst. (1968). 1, 198 [doi:10.1107/S0021889868005339]

Stereology. Proceedings of the Second International Congress for Stereology, Chicago, April 8-13, 1967 edited by H. Elias

J. Appl. Cryst. (1968). 1, 198 [doi:10.1107/S0021889868005340]