Journal of Applied Crystallography

Volume 1, Part 4 (November 1968)

research papers
notes and news

research papers

J. Appl. Cryst. (1968). 1, 199-208 [doi:10.1107/S0021889868005352]

The structure of vapor-quenched Ag-Ge films

T. B. Light and C. N. J. Wagner

J. Appl. Cryst. (1968). 1, 209-217 [doi:10.1107/S0021889868005364]

On choosing off-line automatic X-ray diffractometers

M. F. Davis, C. Groter and H. F. Kay

J. Appl. Cryst. (1968). 1, 218-226 [doi:10.1107/S0021889868005376]

Graphitation partielle de quelques carbones durs. Etude en microscopie et microdiffraction électroniques

A. Oberlin et F. Rousseaux

J. Appl. Cryst. (1968). 1, 227-233 [doi:10.1107/S0021889868005388]

Quantitative investigation of domain structures by Berg-Barrett X-ray diffraction microscopy. I. Determination of small tilt angles in various lattice planes of the crystal

K. Kranjc

J. Appl. Cryst. (1968). 1, 234-241 [doi:10.1107/S002188986800539X]

X-ray diffraction and structure of water

W. Bol

J. Appl. Cryst. (1968). 1, 241-246 [doi:10.1107/S0021889868005406]

Characterization of phases in the 50-60 at. % Te region of the Bi-Te system by X-ray powder diffraction patterns

R. F. Brebrick

J. Appl. Cryst. (1968). 1, 246-249 [doi:10.1107/S0021889868005418]

Low-temperature thermal expansion of LiH, MgO and CaO

D. K. Smith and H. R. Leider

J. Appl. Cryst. (1968). 1, 249-252 [doi:10.1107/S002188986800542X]

Density determination of small solid samples using a modified flotation method and a re-determination of the density of saturated aqueous thallous formate solutions

A. Taylor and N. J. Doyle

J. Appl. Cryst. (1968). 1, 252-254 [doi:10.1107/S0021889868005431]

The effect of preferred orientation on (hk) interferences as shown by electron diffraction of carbon fibres

A. Fourdeux, R. Perret and W. Ruland

J. Appl. Cryst. (1968). 1, 255-257 [doi:10.1107/S0021889868005443]

The effect of multiple diffraction on the determination of electron density distributions

D. Panke and E. Wölfel

J. Appl. Cryst. (1968). 1, 257-262 [doi:10.1107/S0021889868005455]

Profile analysis of random-layer lines

R. Perret and W. Ruland

notes and news

J. Appl. Cryst. (1968). 1, 262 [doi:10.1107/S0021889868005467]